Browse "School of Electrical Engineering(전기및전자공학부)" by Author Park, Jun-Young
Showing results 1 to 60 of 61
| A 118.4 GB/s Multi-Casting Network-on-Chip With Hierarchical Star-Ring Combined Topology for Real-Time Object Recognition Kim, Joo-Young; Park, Jun-Young; Lee, Seung-Jin; Kim, Min-Su; Oh, Jin-Wook; Yoo, Hoi-Jun, IEEE JOURNAL OF SOLID-STATE CIRCUITS, v.45, no.7, pp.1399 - 1409, 2010-07 |
| A 320 mW 342 GOPS Real-Time Dynamic Object Recognition Processor for HD 720p Video Streams Oh, Jin-Wook; Kim, Gyeonghoon; Park, Jun-Young; Hong, Injoon; Lee, Seung-Jin; Kim, Joo-Young; Woo, Jeong-Ho; et al, IEEE JOURNAL OF SOLID-STATE CIRCUITS, v.48, no.1, pp.33 - 45, 2013-01 |
| A 345 mW Heterogeneous Many-Core Processor With an Intelligent Inference Engine for Robust Object Recognition Lee, Seung-Jin; Oh, Jin-Wook; Park, Jun-Young; Kwon, Joon-Soo; Kim, Min-Su; Yoo, Hoi-Jun, IEEE JOURNAL OF SOLID-STATE CIRCUITS, v.46, no.1, pp.42 - 51, 2011-01 |
| A 92-mW Real-Time Traffic Sign Recognition System With Robust Illumination Adaptation and Support Vector Machine Park, Jun-Young; Kwon, Joon-Soo; Oh, Jin-Wook; Lee, Seung-Jin; Kim, Joo-Young; Yoo, Hoi-Jun, IEEE JOURNAL OF SOLID-STATE CIRCUITS, v.47, no.11, pp.2711 - 2723, 2012-11 |
A Comparative Study of the Curing Effects of Local and Global Thermal Annealing on a FinFET Park, Jun-Young; Lee, Geon-Beom; Choi, Yang-Kyu, IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY, v.7, no.1, pp.954 - 958, 2019-08 |
| A Comparative Study on Hot-Carrier Injection in 5-story Vertically Integrated Inversion-Mode and Junctionless-Mode Gate-All-Around MOSFETs Kim, Seong-Yeon; Lee, Byung-Hyun; Hur, Jae; Park, Jun-Young; Jeon, Seung-Bae; Lee, Seung-Wook; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.39, no.1, pp.4 - 7, 2018-01 |
| A Novel Technique for Curing Hot-CarrierInduced Damage by Utilizing the Forward Current of the PN-Junction in a MOSFET Lee, Geon-Beom; Kim, Choong-Ki; Park, Jun-Young; Bang, Tewook; Bae, Hagyoul; Kim, Seong-Yeon; Ryu, Seung-Wan; et al, IEEE ELECTRON DEVICE LETTERS, v.38, no.8, pp.1012 - 1014, 2017-08 |
| A Recoverable Synapse Device Using a Three-Dimensional Silicon Transistor Hur, Jae; Jang, Byung Chul; Park, Jihun; Moon, Dong-Il; Bae, Hagyoul; Park, Jun-Young; Kim, Gun-Hee; et al, ADVANCED FUNCTIONAL MATERIALS, v.28, no.47, 2018-11 |
| A Study of High-Temperature Effects on an Asymmetrically Doped Vertical Pillar-Type Field-Effect Transistor Han, Joon-Kyu; Hur, Jae; Kim, Wu-Kang; Park, Jun-Young; Lee, Seung-Wook; Kim, Seong-Yeon; Yu, Ji-Man; et al, IEEE TRANSACTIONS ON NANOTECHNOLOGY, v.19, pp.52 - 55, 2020-01 |
| A Vocabulary Forest Object Matching Processor With 2.07 M-Vector/s Throughput and 13.3 nJ/Vector Per-Vector Energy for Full-HD 60 fps Video Object Recognition Lee, Kyuho Jason; Kim, Gyeong-Hoon; Park, Jun-Young; Yoo, Hoi-Jun, IEEE JOURNAL OF SOLID-STATE CIRCUITS, v.50, no.4, pp.1059 - 1069, 2015-04 |
| Analysis of Damage Curing in a MOSFET with Joule Heat Generated by Forward Junction Current at the Source and Drain Lee, Geon-Beom; Kim, Choong-Ki; Bang, Tewook; Yoo, Min-Soo; Park, Jun-Young; Choi, Yang-Kyu, MICROELECTRONICS RELIABILITY, v.104, 2020-01 |
| Controllable electrical and physical breakdown of poly-crystalline silicon nanowires by thermally assisted electromigration Park, Jun-Young; Moon, Dong-Il; Seol, Myeong-Lok; Jeon, Chang-Hoon; Jeon, Gwang-Jae; Han, Jin-Woo; Kim, Choong-Ki; et al, SCIENTIFIC REPORTS, v.6, 2016-01 |
| Curing of Aged Gate Dielectric by the Self-Heating Effect in MOSFETs Park, Jun-Young; Moon, Dong-Il; Lee, Geon-Beom; Choi, Yang-Kyu, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.67, no.3, pp.777 - 788, 2020-03 |
| Curing of Hot-Carrier Induced Damage by Gate-Induced Drain Leakage Current in Gate-All-Around FETs Park, Jun-Young; Yun, Dae-Hwan; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.40, no.12, pp.1909 - 1912, 2019-12 |
| Demonstration of a Curable Nanowire FinFET Using Punchthrough Current to Repair Hot-Carrier Damage Park, Jun-Young; Hur, Jae; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.39, no.2, pp.180 - 183, 2018-02 |
| Demonstration of Thermally-Assisted Programming with High Speed and Improved Reliability for Junctionless Nanowire NOR Flash Memory Yu, Ji-Man; Park, Jun-Young; Lee, Geon-Beom; Han, Joon-Kyu; Kim, Myung-Su; Hur, Jae; Yun, Dae-Hwan; et al, IEEE TRANSACTIONS ON NANOTECHNOLOGY, v.18, pp.1110 - 1113, 2019-10 |
| Electro-Thermal Annealing Method for Recovery of Cyclic Bending Stress in Flexible a-IGZO TFTs Lee, Myung Keun; Kim, Choong-Ki; Park, Jeong Woo; Kim, Eungtaek; Seol, Myeong-Lok; Park, Jun-Young; Choi, Yang-Kyu; et al, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.64, no.8, pp.3189 - 3192, 2017-08 |
| Electro-Thermal Erasing at 10(4)-Fold Faster Speeds in Charge-Trap Flash Memory Kim, Myung-Su; Ahn, Dae-Chul; Park, Jun-Young; Seo, Myungsoo; Kim, Seong-Yeon; Kim, Wu-Kang; Yun, Dae-Hwan; et al, IEEE ELECTRON DEVICE LETTERS, v.40, no.2, pp.196 - 199, 2019-02 |
| Electrothermal Annealing (ETA) Method to Enhance the Electrical Performance of Amorphous-Oxide-Semiconductor (AOS) Thin-Film Transistors (TFTs) Kim, Choong-Ki; Kim, Eungtaek; Lee, Myung Keun; Park, Jun-Young; Seol, Myeong-Lok; Bae, Hagyoul; Bang, Tewook; et al, ACS APPLIED MATERIALS & INTERFACES, v.8, no.36, pp.23820 - 23826, 2016-09 |
| Electrothermal Annealing to Enhance the Electrical Performance of an Exfoliated MOS2 Field-Effect Transistor Han, Joon-Kyu; Park, Jun-Young; Kim, Choong-Ki; Kwon, Jeong Hyun; Kim, Myeong-Soo; Hwang, Byeong Woon; Kim, Da-Jin; et al, IEEE ELECTRON DEVICE LETTERS, v.39, no.10, pp.1532 - 1535, 2018-10 |
| Eletrothermal analysis of poly-si nanowire and its application to localized annealing of gate-all-around field-effect transistor = 폴리실리콘 나노와이어의 전기적, 열적 특성분석 및 이를 바탕으로 한 트랜지스터에의 응용link Park, Jun-Young; 박준영; et al, 한국과학기술원, 2016 |
| Energy-efficient context-aware real-time object recognition processor = 에너지 효율적인 상황인지 기반 실시간 물체인식 프로세서link Park, Jun-Young; 박준영; et al, 한국과학기술원, 2014 |
| First Demonstration of a Wrap-Gated CNT-FET with Vertically-Suspended Channels Lee, Dong-Il; Lee, Byung-Hyun; Yoon, Jin-Su; Choi, Bong-Sik; Park, Jun-Young; Ahn, Dae-Chul; Kim, Choong-Ki; et al, International Electron Devices Meeting (IEDM), International Electron Devices Meeting (IEDM), 2016-12-05 |
| Functional Circuitry on Commercial Fabric via Textile-Compatible Nanoscale Film Coating Process for Fibertronics Bae, Hagyoul; Jang, Byung Chul; Park, Hongkeun; Jung, Soo-Ho; Lee, Hye Moon; Park, Jun-Young; Jeon, Seung-Bae; et al, NANO LETTERS, v.10, no.10, pp.6443 - 6452, 2017-10 |
| High-Pressure Deuterium Annealing for Trap Passivation for a 3-D Integrated Structure Lee, Jung-Woo; Han, Joon-Kyu; Wang, Dong-Hyun; Yun, Seong-Yun; Oh, Jeong-Seob; Bang, Byeong-Chan; Cha, Won-Hyo; et al, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.71, no.4, pp.2801 - 2804, 2024-04 |
| Improved SOI FinFETs Performance with Low-Temperature Deuterium Annealing Ku, Ja-Yun; Yu, Ji-Man; Wang, Dong-Hyun; Jung, Dae-Han; Han, Joon-Kyu; Choi, Yang-Kyu; Park, Jun-Young, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.70, no.7, pp.3958 - 3962, 2023-07 |
| Improved Split C-V Technique for Accurate Extraction of Mobility by Considering Effective Inversion Charges in p-Channel Si0.8Ge0.2 MOSFET Bang, Te-Wook; Bae, Hagyoul; Kim, Choong-Ki; Hur, Jae; Park, Jun-Young; Ahn, Dae-Chul; Kim, Gun-Hee; et al, 한국 반도체 학술 대회, 한국 반도체 학술 대회, 2016-02-23 |
| Improved Technique for Extraction of Effective Mobility by Considering Gate Bias-Dependent Inversion Charges in a Floating-Body Si/SiGe pMOSFET Bae, Hagyoul; Bang, Tewook; Kim, Choong-Ki; Hur, Jae; Kim, Seyeob; Jeon, Chang-Hoon; Park, Jun-Young; et al, JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, v.17, no.5, pp.3247 - 3250, 2017-05 |
| Intelligent Network-on-Chip With Online Reinforcement Learning for Portable HD Object Recognition Processor Park, Jun-Young; Hong, In-Joon; Kim, Gyeong-Hoon; Nam, Byeong-Gyu; Yoo, Hoi-Jun, IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, v.61, no.2, pp.476 - 484, 2014-02 |
| Investigation of electrothermal annealing to enhance the reliability and the performance of field-effect transistors = 국부적 전열 어닐링을 통한 전계효과 트랜지스터의 신뢰성 및 출력 특성의 향상link Park, Jun-Young; Choi, Yang-Kyu; et al, 한국과학기술원, 2020 |
| Investigation of Self-Heating Effects in Gate-All-Around MOSFETs With Vertically Stacked Multiple Silicon Nanowire Channels Park, Jun-Young; Lee, Byung-Hyun; Chang, Ki Soo; Kim, Dong Uk; Jeong, Chanbae; Kim, Choong-Ki; Bae, Hagyoul; et al, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.64, no.11, pp.4393 - 4399, 2017-11 |
| Joule Heating to Enhance the Performance of a Gate-All-Around Silicon Nanowire Transistor Jeon, Chang-Hoon; Park, Jun-Young; Seol, Myeong-Lok; Moon, Dong-Il; Hur, Jae; Bae, Hagyoul; Jeon, Seung-Bae; et al, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.63, no.6, pp.2288 - 2292, 2016-06 |
| LF Noise Analysis for Trap Recovery in Gate Oxides Using Built-In Joule Heater Jeon, Chang-Hoon; Kim, Choong-Ki; Park, Jun-Young; Jeong,Ui-Sik; Lee, Byung-Hyun; Kim, Kyung Rok; Choi, Yang-Kyu, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.64, no.12, pp.5081 - 5086, 2017-12 |
| Local Electro-Thermal Annealing for Repair of Total Ionizing Dose-Induced Damage in Gate-All-Around MOSFETs Park, Jun-Young; Moon, Dong-Il; Bae, Hagyoul; Roh, Young Tak; Seol, Myeong-Lok; Lee, Byung-Hyun; Jeon, Chang-Hoon; et al, IEEE ELECTRON DEVICE LETTERS, v.37, no.7, pp.843 - 846, 2016-07 |
| Localized Electrothermal Annealing with Nanowatt Power for a Silicon Nanowire Field-Effect Transistor Park, Jun-Young; Lee, Byung-Hyun; Lee, Geon-Beom; Bae, Hagyoul; Choi, Yang-Kyu, ACS APPLIED MATERIALS & INTERFACES, v.10, no.5, pp.4838 - 4843, 2018-02 |
| LOW-POWER, REAL-TIME OBJECT-RECOGNITION PROCESSORS FOR MOBILE VISION SYSTEMS Oh, Jin-Wook; Kim, Gyeong-Hoon; Hong, In-Joon; Park, Jun-Young; Lee, Seung-Jin; Kim, Joo-Young; Woo, Jeong-Ho; et al, IEEE MICRO, v.32, no.6, pp.38 - 50, 2012-11 |
| Low-Temperature Deuterium Annealing to Improve Performance and Reliability in a MOSFET Yu, Ji-Man; Wang, Dong-Hyun; Ku, Ja-Yun; Han, Joon-Kyu; Jung, Dae-Han; Park, Jun-Young; Choi, Yang-Kyu, SOLID-STATE ELECTRONICS, v.197, 2022-11 |
| Lowering of Schottky Barrier Height in a MOSFET by Deuterium Annealing Yu, Jiman; Wang, Dong-Hyun; Han, Joon-Kyu; Yun, Seong-Yun; Park, Jun-Young; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.44, no.7, pp.1032 - 1035, 2023-07 |
| Method for increasing driving current of junctionless transistor Choi, Yang-Kyu; Park, Jun-Young; Jeon, Chang-Hoon, 2018-09-25 |
| Nano-electromechanical Switch Based on a Physical Unclonable Function for Highly Robust and Stable Performance in Harsh Environments Hwang, Kyu-Man; Park, Jun-Young; Bae, Hagyoul; Lee, Seung-Wook; Kim, Choong-Ki; Seo, Myungsoo; Im, Hwon; et al, ACS NANO, v.11, no.12, pp.12547 - 12552, 2017-12 |
| Nanoscale FET-Based Transduction toward Sensitive Extended-Gate Biosensors Kwon, Jae; Lee, Byung-Hyun; Kim, Seong-Yeon; Park, Jun-Young; Bae, Hagyoul; Choi, Yang-Kyu; Ahn, Jae-Hyuk, ACS SENSORS, v.4, no.6, pp.1724 - 1729, 2019-06 |
| On-Chip Curing by Microwave for Long Term Usage of Electronic Devices in Harsh Environments Park, Jun-Young; Kim, Weon-Guk; Bae, Hagyoul; Jin, Ik Kyeong; Kim, Da-Jin; Im, Hwon; Tcho, Il-Woong; et al, SCIENTIFIC REPORTS, v.8, 2018-10 |
| On-chip learning multi-class support vector machine processor = 학습 기능을 내장한 다중 분류 Support Vector Machine 프로세서link Park, Jun-Young; 박준영; et al, 한국과학기술원, 2011 |
| Physically Transient Memory on a Rapidly Dissoluble Paper for Security Application Bae, Hagyoul; Lee, Byung-Hyun; Lee, Dongil; Seol, Myeong-Lok; Kim, Daewon; Han, Jin-Woo; Kim, Choong-Ki; et al, SCIENTIFIC REPORTS, v.6, 2016-12 |
| Power Reduction for Recovery of a FinFET by Electrothermal Annealing Han, Joon-Kyu; Park, Jun-Young; Choi, Yang-Kyu, SOLID-STATE ELECTRONICS, v.151, pp.6 - 10, 2019-01 |
| Power Reduction in Punch-Through Current-Based Electro-Thermal Annealing in Gate-All-Around FETs Kim, Min-Kyeong; Choi, Yang-Kyu; Park, Jun-Young, MICROMACHINES, v.13, no.1, 2022-01 |
| Sanitization of Data in Nanoscale Flash Memory by Thermal Erasing and Reuse of Storage Park, Jun-Young; Moon, Dong-Il; Kim, Seong-Yeon; Im, Hwon; Chang, Ki Soo; Jeong, Chanbae; Choi, Yang-Kyu, PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, v.215, no.14, 2018-07 |
| Self-Curable Gate-All-Around MOSFETs Using Electrical Annealing to Repair Degradation Induced From Hot-Carrier Injection Park, Jun-Young; Moon, Dong-Il; Seol, Myeong-Lok; Kim, Choong-Ki; Jeon, Chang-Hoon; Bae, Hagyoul; Bang, Tewook; et al, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.63, no.3, pp.910 - 915, 2016-03 |
| Self-Heating Effects in 3-D Vertical-NAND (V-NAND) Flash Memory Yun, Gyeong-Jun; Yun, Dae-Hwan; Park, Jun-Young; Kim, Seong-Yoen; Choi, Yang-Kyu, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.67, no.12, pp.5505 - 5510, 2020-12 |
| Self-powered data erasing of nanoscale flash memory by triboelectricity Jin, Ik Kyeong; Park, Jun-Young; Lee, Byung-Hyun; Jeon, Seung-Bae; Tcho, Il-Woong; Park, Sang-Jae; Kim, Weon-Guk; et al, NANO ENERGY, v.52, pp.63 - 70, 2018-10 |
| Suppression of Self-Heating Effects in 3-D V-NAND Flash Memory Using a Plugged Pillar-Shaped Heat Sink Park, Jun-Young; Yun, Dae-Hwan; Kim, Seong-Yeon; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.40, no.2, pp.212 - 215, 2019-02 |
| Sustainable Electronics for Nano-Spacecraft in Deep Space Missions Moon, Dong-Il; Park, Jun-Young; Han, Jin-Woo; Jeon, Gwang-Jae; Kim, Jee-Yeon; Moon, Jin-Bum; Seol, Myeong-Lok; et al, International Electron Devices Meeting (IEDM), IEEE, 2016-12-07 |
| Thermal hardware-based data security device that permanently erases data by using local heat generation phenomenon and method thereof Choi, Yang-Kyu; Park, Jun-Young |
| Three-Dimensional Fin-Structured Semiconducting Carbon Nanotube Network Transistor Lee, Dong-Il; Lee, Byung-Hyun; Yoon, Jinsu; Ahn, Dae-Chul; Park, Jun-Young; Hur, Jae; Kim, Myung-Su; et al, ACS NANO, v.10, no.12, pp.10894 - 10900, 2016-12 |
| Threshold Voltage Tuning Technique in Gate-All-Around MOSFETs by Utilizing Gate Electrode With Potential Distribution Park, Jun-Young; Bae, Hagyoul; Moon, Dong-Il; Jeon, Chang-Hoon; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.37, no.11, pp.1391 - 1394, 2016-11 |
| Triboelectric nanogenerator for a repairable transistor with self-powered electro-thermal annealing Kim, Weon-Guk; Han, Joon-Kyu; Tcho, Il-Woong; Park, Jun-Young; Yu, Ji-Man; Choi, Yang-Kyu, NANO ENERGY, v.76, pp.105000, 2020-10 |
| Tunneling field-effect transistor with a plurality of nano-wires and fabrication method thereof Choi, Yang-Kyu; Park, Jun-Young, 2018-06-12 |
| Ultra-Fast Erase Method of SONOS Flash Memory by Instantaneous Thermal Excitation Ahn, Dae-Chul; Seol, Myeong-Lok; Hur, Jae; Moon, Dong-Il; Lee, Byung-Hyun; Han, Jin-Woo; Park, Jun-Young; et al, IEEE ELECTRON DEVICE LETTERS, v.37, no.2, pp.190 - 192, 2016-02 |
| Vertically Integrated zRAM (VI-zRAM): Toward Extremely Scaled Memory Lee, Byung-Hyun; Ahn, Dae-Chul; Kang, Min-Ho; Jeon, Seung-Bae; Bang, Te-Wook; Bae, Hagyoul; Park, Jun-Young; et al, ECS PRIME, ECS PRIME, 2016-10-05 |
| Vertically-integrated 3-dimensional flash memory for high reliable flash memory and fabrication method thereof Choi, Yang-Kyu; Park, Jun-Young |
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