Sustainable Electronics for Nano-Spacecraft in Deep Space Missions

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An on-the-fly self-healing device is experimentally demonstrated for sustainability of space electronics. A high temperature generated by Joule heating in a gate electrode provides on-chip annealing of damages induced by ionizing radiation, hot carrier, and tunneling stress. With the healing process, a highly scaled silicon nanowire gate-all-around device shows improved long-term reliability in logic, floating body DRAM, and charge-trap Flash. A thermally isolated gate structure is proposed to enhance the self-healing effect.
Publisher
IEEE
Issue Date
2016-12-07
Language
English
Citation

International Electron Devices Meeting (IEDM)

URI
http://hdl.handle.net/10203/220034
Appears in Collection
EE-Conference Papers(학술회의논문)
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