Browse "EE-Journal Papers(저널논문)" by Author Lee, Hee Chul
Showing results 39 to 98 of 120
| Effect of rapid thermal annealing on the interface trap density between Pt and (Ba,Sr)TiO3 thin film Kwak, DH; Jang, BT; Cha, SY; Lee, JS; Lee, Hee Chul, INTEGRATED FERROELECTRICS, v.17, no.1-4, pp.179 - 186, 1997 |
| Effect of sputtering pressure on microstructure and bolometric properties of Nb: TiO2-x films for infrared image sensor applications Reddy, Y. Ashok Kumar; Shin, Young Bong; Kang, In-Ku; Lee, Hee Chul, JOURNAL OF APPLIED PHYSICS, v.119, no.4, 2016-01 |
| Effect of substrate temperature on polycrystalline Cd0.9Zn0.1Te thin films studied by Raman scattering spectroscopy Sridharan, M; Mekaladevi, M; Narayandass, SK; Mangalaraj, D; Lee, Hee Chul, CRYSTAL RESEARCH AND TECHNOLOGY, v.39, pp.328 - 332, 2004-04 |
| Effects of hydrazine surface treatment on HgCdTe long-wavelength infrared photodiodes Lee, MY; Lee, YS; Lee, Hee Chul, JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS EXPRESS LETTERS, v.44, no.37-41, pp.1252 - 1255, 2005 |
| Effects of Ir electrodes on the dielectric constants of Ba0.5Sr0.5TiO3 films Cha, SY; Jang, BT; Lee, Hee Chul, JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, v.38, no.1AB, pp.49 - 51, 1999-01 |
| ELECTRON-BEAM EXPOSURE (EBE) AND EPITAXY OF GAAS FILMS ON CAF2/SI STRUCTURES Lee, Hee Chul; ASANO, T; ISHIWARA, H; FURUKAWA, S, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS, v.27, no.9, pp.1616 - 1625, 1988-09 |
| Enhanced bolometric properties of nickel oxide thin films for infrared image sensor applications by substitutional incorporation of Li Kang, In-Ku; Reddy, Y. Ashok Kumar; Shin, Young Bong; Kim, Woo Young; Lee, Hee Chul, CERAMICS INTERNATIONAL, v.44, no.7, pp.7808 - 7813, 2018-05 |
| Enhanced bolometric properties of TiO2-x thin films by thermal annealing Reddy, Y. Ashok Kumar; Shin, Young Bong; Kang, In-Ku; Lee, Hee Chul; Reddy, P. Sreedhara, APPLIED PHYSICS LETTERS, v.107, no.2, 2015-07 |
| Enhancement of the saturation mobility in a ferroelectric-gated field-effect transistor by the surface planarization of ferroelectric film Kim, Woo Young; Jeon, Gwang-Jae; Kang, In-Ku; Shim, Hyun Bin; Lee, Hee Chul, THIN SOLID FILMS, v.591, pp.1 - 7, 2015-09 |
| Enhancement of the steady state minority carrier lifetime in HgCdTe photodiode using ECR plasma hydrogenation Jung, H; Lee, Hee Chul; Kim, Choong Ki, JOURNAL OF ELECTRONIC MATERIALS, v.25, no.8, pp.1266 - 1269, 1996-08 |
| Etching behavior and damage recovery of SrBi2Ta2O9 thin films Lee, WJ; Cho, CR; Kim, SH; You, IK; Kim, BW; Yu, BG; Shin, CH; et al, JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, v.38, no.12A, pp.1428 - 1431, 1999-12 |
| Fabrication and characterization of MFISFET using Al2O3 insulating layer for non-volatile memory Shin, CH; Cha, SY; Lee, Hee Chul; Lee, WJ; Yu, BG; Kwak, DH, INTEGRATED FERROELECTRICS, v.34, no.1-4, pp.1553 - 1560, 2001 |
| FORMATION OF GAAS-ON-INSULATOR STRUCTURES ON SI SUBSTRATES BY HETEROEPITAXIAL GROWTH OF CAF2 AND GAAS ASANO, T; ISHIWARA, H; Lee, Hee Chul; TSUTSUI, K; FURUKAWA, S, JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, v.25, no.2, pp.139 - 141, 1986-02 |
| HgCdTe-MISFET fabrication with multi-step surface passivation and quantum effects Lee, CH; Paik, SW; Park, JW; Lee, J; Moon, YM; Choi, JB; Jung, H; et al, JOURNAL OF ELECTRONIC MATERIALS, v.27, no.6, pp.668 - 671, 1998-06 |
| High injection efficiency readout circuit for low resistance infra-red detector Yoon, N; Kim, B; Lee, Hee Chul; Kim, CK, ELECTRONICS LETTERS, v.35, no.18, pp.1507 - 1508, 1999-09 |
| High-Dynamic-Range ROIC With Asynchronous Self-Controlled Two-Gain Modes for MWIR Focal Plane Arrays Kim, Chiyeon; Woo, Doo Hyung; Lee, Hee Chul, IEEE SENSORS JOURNAL, v.19, no.2, pp.615 - 622, 2019-01 |
| Hydrogenation of ZnS passivation on narrow-band gap HgCdTe White, JK; Musca, CA; Lee, Hee Chul; Faraone, L, APPLIED PHYSICS LETTERS, v.76, no.17, pp.2448 - 2450, 2000-04 |
| Hysteresis analysis in capacitance-voltage characteristics of Pt/(Ba,Sr)TiO3/Pt structures Kwak, DH; Jang, BT; Cha, SY; Lee, SH; Lee, Hee Chul; Yu, BG, INTEGRATED FERROELECTRICS, v.13, no.1-3, pp.413 - 419, 1996 |
| Improvement of dielectric properties by inserting oxygen-rich initial layer in Pt/(Ba,Sr)TiO3/Pt structure Kwak, DH; Lee, SH; Jang, BT; Cha, SY; Lee, Hee Chul, INTEGRATED FERROELECTRICS, v.20, no.1-4, pp.205 - 214, 1998 |
| Improvement of the thermal stability of Nb:TiO2-x samples for uncooled infrared detectors Reddy, Y. Ashok Kumar; Kang, In-Ku; Shin, Young Bong; Lee, Hee Chul, JOURNAL OF PHYSICS D-APPLIED PHYSICS, v.51, no.2, 2018-01 |
| In-pixel edge detection circuit without non-uniformity correction for an infrared focal plane array (IRFPA) Kiw, CB; Woo, DH; Lee, Yong Soo; Lee, Hee Chul, IEICE TRANSACTIONS ON ELECTRONICS, v.E91C, pp.235 - 239, 2008-02 |
| Influence of Nb Doping Concentration on Bolometric Properties of RF Magnetron Sputtered Nb:TiO2-x Films Reddy, Y. Ashok Kumar; Shin, Young Bong; Kang, In-Ku; Lee, Hee Chul, JOURNAL OF ELECTRONIC MATERIALS, v.47, no.3, pp.2171 - 2176, 2018-03 |
| Influence of passivation layer on thermal stability of Nb:TiO2-x samples for shutter-less infrared image sensors Reddy, Y. Ashok Kumar; Ajitha, B.; Shin, Young Bong; Kang, In-Ku; Lee, Hee Chul, INFRARED PHYSICS & TECHNOLOGY, v.100, pp.52 - 56, 2019-08 |
| Influence of thermal annealing on the structural and optical properties of polycrystalline Cd0.96Zn0.04Te thin films Sridharan, MG; Narayandass, SK; Mangalaraj, D; Lee, Hee Chul, JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, v.7, pp.1483 - 1491, 2005-06 |
| Influence of TiO2 adhesion layer thickness on properties of (Ba,Sr)TiO3 thin films Kim, YJ; Lee, YS; Lee, Hee Chul, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, v.44, pp.6167 - 6169, 2005-08 |
| Iridium thin film as a bottom electrode for high dielectric (Ba,Sr)TiO3 capacitors Cha, SY; Jang, BT; Kwak, DH; Shin, CH; Lee, Hee Chul, INTEGRATED FERROELECTRICS, v.17, no.1-4, pp.187 - 195, 1997 |
| Layout Modification of a PD-SOI n-MOSFET for Total Ionizing Dose Effect Hardening Roh, Young Tak; Lee, Hee Chul, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.66, no.1, pp.308 - 315, 2019-01 |
| Local Electro-Thermal Annealing for Repair of Total Ionizing Dose-Induced Damage in Gate-All-Around MOSFETs Park, Jun-Young; Moon, Dong-Il; Bae, Hagyoul; Roh, Young Tak; Seol, Myeong-Lok; Lee, Byung-Hyun; Jeon, Chang-Hoon; et al, IEEE ELECTRON DEVICE LETTERS, v.37, no.7, pp.843 - 846, 2016-07 |
| Low Power Pixel-Level ADC Readout Circuit for an Amorphous Silicon-Based Microbolometer Ha, Dong-Heon; Hwang, Chi Ho; Lee, Yong Soo; Lee, Hee Chul, IEICE TRANSACTIONS ON ELECTRONICS, v.E92C, pp.708 - 712, 2009-05 |
| Low-Noise and Wide-Dynamic-Range ROIC With a Self-Selected Capacitor for SWIR Focal Plane Arrays Kim, Yeong Seon; Woo, Doo Hyung; Jo, Young Min; Kang, Sang Gu; Lee, Hee Chul, IEEE SENSORS JOURNAL, v.17, no.1, pp.179 - 184, 2017-01 |
| Measurement of the steady-state minority carrier diffusion length in a HgCdTe photodiode Jung, H; Lee, Hee Chul; Kim, CK, JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, v.35, no.10B, pp.1321 - 1323, 1996-10 |
| Microstructural Effects on Nickel Oxide Film Properties in an Infrared Electrochromic Window for Shutter-Less Infrared Sensor Application Shim, Hyun Bin; Kim, Woo Young; Kang, In-Ku; Lee, Hee Chul, IEEE SENSORS JOURNAL, v.17, no.20, pp.6522 - 6528, 2017-10 |
| Mismatch-tolerant read-in IC with voltage-drop compensation for infrared scene projectors Shin, Uisub; Cho, Min Ji; Lee, Hee Chul, IEICE ELECTRONICS EXPRESS, v.15, no.11, 2018-06 |
| MSM Photodetector on a Polysilicon Membrane for a Silicon-Based Wafer-Level Packaged LED Kim, Jin Kwan; Lee, Hee Chul, IEEE PHOTONICS TECHNOLOGY LETTERS, v.25, no.24, pp.2462 - 2465, 2013-12 |
| Multiple integration method for a high signal-to-noise ratio readout integrated circuit Kang, SG; Woo, DH; Lee, Hee Chul, IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS, v.52, pp.553 - 557, 2005-09 |
| Nanoporous Pirani sensor based on anodic aluminum oxide Jeon, Gwang-Jae; Kim, Woo-Young; Shim, Hyun Bin; Lee, Hee Chul, APPLIED PHYSICS LETTERS, v.109, no.12, 2016-09 |
| Nb doping effect on TiO2-x films for bolometer applications Shin, Young Bong; Reddy, Y. Ashok Kumar; Kang, In-Ku; Lee, Hee Chul, JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, v.91, pp.128 - 135, 2016-04 |
| New surface treatment method for improving the interface characteristics of CdTe/Hg1-xCdxTe heterostructure Lee, SH; Shin, H; Lee, Hee Chul; Kim, CK, JOURNAL OF ELECTRONIC MATERIALS, v.26, no.6, pp.556 - 560, 1997-06 |
| Noise bandwidth suppression for low noise readout circuit Kim, B; Lee, Hee Chul, ELECTRONICS LETTERS, v.38, no.12, pp.558 - 560, 2002-06 |
| Novel current-mode background suppression for 2-D LWIR applications Woo, DH; Kang, SG; Lee, Hee Chul, IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS, v.52, pp.606 - 610, 2005-09 |
| Novel two step background suppression for 2-D LWIR application Woo, DH; Kang, SG; Lee, Hee Chul, IEICE TRANSACTIONS ON ELECTRONICS, v.E87C, pp.1649 - 1651, 2004-09 |
| Optical and opto-electronic properties of polycrystalline Cd0.96Zn0.04Te thin films Sridharan, M; Narayandass, SK; Mangalaraj, D; Lee, Hee Chul, CRYSTAL RESEARCH AND TECHNOLOGY, v.38, no.6, pp.479 - 487, 2003 |
| Optical constants of vacuum-evaporated Cd0.96Zn0.04Te thin films measured by spectroscopic ellipsometry Sridharan, M; Narayandass, SK; Mangalaraj, D; Lee, Hee Chul, JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, v.13, no.8, pp.471 - 476, 2002-08 |
| OPTIMIZATION OF THE GROWTH-CONDITIONS OF HETEROEPITAXIAL GAAS FILMS ON CAF2/SI STRUCTURES Lee, Hee Chul; ASANO, T; ISHIWARA, H; FURUKAWA, S, JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, v.25, no.7, pp.595 - 597, 1986-07 |
| Optimum solution of on-chip A/D converter for cooled type infrared focal plane array Kang, SG; Woo, DH; Lee, Hee Chul, IEICE TRANSACTIONS ON ELECTRONICS, v.E88C, pp.413 - 419, 2005-03 |
| Oxygen Atmosphere Annealing Effect on the Thermal Stability of TiO2-x Based Films for Shutter-Less Infrared Image Sensors Reddy, Y. Ashok Kumar; Kang, In-Ku; Shin, Young Bong; Lee, Hee Chul, Key Engineering Materials, v.775, pp.272 - 277, 2018-08 |
| P-MOSFET latch-based monolithic signal-processing circuit for nuclear event detector Kim, Tae-Hyo; Lee, Hee Chul; Woo, Doo Hyung, NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, v.904, pp.93 - 99, 2018-10 |
| Photocurrent effect on the zero-bias dynamic resistance of HgCdTe photodiode Kim, K; Jung, H; Shin, H; Lee, Hee Chul; Kim, CK, JOURNAL OF ELECTRONIC MATERIALS, v.26, no.6, pp.662 - 666, 1997-06 |
| Pixel-Level ADC with Two-Step Integration for 2-D Microbolometer IRFPA Hwang, Chi Ho; Woo, Doo Hyung; Lee, Hee Chul, IEICE TRANSACTIONS ON ELECTRONICS, v.E94C, no.12, pp.1909 - 1912, 2011-12 |
| Pixelwise readout circuit with current mirroring injection for microbolometer FPAs Hwang, C. H.; Kim, C. B.; Lee, Y. S.; Lee, Hee Chul, ELECTRONICS LETTERS, v.44, no.12, pp.732 - 121, 2008-06 |
| Plasma induced type conversion in mercury cadmium telluride Agnihotri, OP; Lee, Hee Chul; Yang, KD, SEMICONDUCTOR SCIENCE AND TECHNOLOGY, v.17, no.10, pp.11 - 19, 2002-10 |
| Platinum bottom electrodes formed by electron-beam evaporation for high-dielectric thin films Lee, Hee Chul; Kim, Ho Gi, JAPANESE JOURNAL OF APPLIED PHYSICS, v.34, no.9B, pp.5220 - 5223, 1995-01 |
| Proposal of a ferroelectric multi-bit memory structure for reliable operation at sub-100 nm scale Kim, Woo-Young; Lee, Hee Chul, MICRO & NANO LETTERS, v.10, no.12, pp.700 - 702, 2015-12 |
| Radiation-hardened gate-around n-MOSFET structure for radiation-tolerant application-specific integrated circuits Lee, Min Su; Lee, Hee Chul, JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.61, no.10, pp.1670 - 1674, 2012-11 |
| Raman scattering studies on B+ implanted Cd0.96Zn0.04Te thin films Sridharan, M; Narayandass, SK; Mangalaraj, D; Lee, Hee Chul, VACUUM, v.68, no.2, pp.119 - 122, 2002-10 |
| Raman scattering studies on polycrystalline Cd0.9Zn0.1Te thin films Sridharan, MG; Mekaladevi, M; Narayandass, SK; Mangalaraj, D; Lee, Hee Chul, JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, v.7, pp.1479 - 1482, 2005-06 |
| Raman scattering, photoluminescence and spectroscopic ellipsometry studies on polycrystalline Cd0.96Zn0.04Te thin films Sridharan, M; Narayandass, SK; Mangalaraj, D; Lee, Hee Chul, JOURNAL OF ALLOYS AND COMPOUNDS, v.346, no.1-2, pp.100 - 106, 2002-11 |
| Rapid thermal diffusion of indium in p-HgCdTe/CdTe Park, SM; Kim, JM; Lee, Hee Chul; Kim, Choong Ki, JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, v.35, no.12A, pp.1554 - 1557, 1996-12 |
| Reliability of High Dielectric Ba0.5Sr0.5TiO3 Capacitors Using Iridium Electrode Lee, Hee Chul; S.Y.Cha; B.T.Jang, INTEGRATED FERROELECTRICS, v.24, no.1-4, pp.45 - 55, 1999-01 |
| Room-temperature photoreflectance and photoluminescence of heavily Si-doped GaAs Lee, Chul; Lee, Nam-Young; Lee, Kyu-Jang; Kim, Jae-Eun; Park, Hae Yong; Kwak, Dong-Hwa; Lee, Hee Chul; et al, Journal of Applied Physics, Vol.77, No.12, pp.6727-6729, 1995-06-15 |
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