Browse "EE-Journal Papers(저널논문)" by Subject reliability
Showing results 1 to 39 of 39
| 1000-Fold Lifetime Extension of a Nickel Electromechanical Contact Device via Graphene Seo, Min-Ho; Ko, Jae Hyeon; Lee, Jeong-Oen; Ko, Seung-Deok; Mun, Jeong-Hun; Cho, Byung-Jin; Kim, Yong-Hyun; et al, ACS APPLIED MATERIALS INTERFACES, v.10, no.10, pp.9085 - 9093, 2018-03 |
A Comparative Study of the Curing Effects of Local and Global Thermal Annealing on a FinFET Park, Jun-Young; Lee, Geon-Beom; Choi, Yang-Kyu, IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY, v.7, no.1, pp.954 - 958, 2019-08 |
| A Comparative Study on Hot-Carrier Injection in 5-story Vertically Integrated Inversion-Mode and Junctionless-Mode Gate-All-Around MOSFETs Kim, Seong-Yeon; Lee, Byung-Hyun; Hur, Jae; Park, Jun-Young; Jeon, Seung-Bae; Lee, Seung-Wook; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.39, no.1, pp.4 - 7, 2018-01 |
| A Complementary Dual-Contact MEMS Switch Using a "Zipping" Technique Song, Yong-Ha; Kim, Min-Wu; Seo, Min-Ho; Yoon, Jun-Bo, JOURNAL OF MICROELECTROMECHANICAL SYSTEMS, v.23, no.3, pp.710 - 718, 2014-06 |
| A comprehensive modeling of dynamic negative-bias temperature instability in PMOS body-tied FinFETs Lee, H; Lee, CH; Park, D; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.27, no.4, pp.281 - 283, 2006-04 |
| A Highly Reliable MEMS Relay With Two-Step Spring System and Heat Sink Insulator for High-Power Switching Applications Yoon, Yong Hoon; Song, Yong-Ha; Ko, Seung-Deok; Han, Chang-Hoon; Yun, Geon-Sik; Seo, Min-Ho; Yoon, Jun-Bo, JOURNAL OF MICROELECTROMECHANICAL SYSTEMS, v.25, no.1, pp.217 - 226, 2016-02 |
| A Highly Reliable Two-Axis MEMS Relay Demonstrating a Novel Contact Refresh Method Song, Yong-Ha; Ko, Seung-Deok; Yoon, Jun-Bo, JOURNAL OF MICROELECTROMECHANICAL SYSTEMS, v.24, no.5, pp.1495 - 1502, 2015-10 |
| A Low Contact Resistance 4-Terminal Mems Relay: Theoretical Analysis, Design, and Demonstration Yoon, Yong Hoon; Jin, Yun Su; Kim, Chang-Keun; Hong, Songcheol; Yoon, Jun-Bo, JOURNAL OF MICROELECTROMECHANICAL SYSTEMS, v.27, no.3, pp.497 - 505, 2018-06 |
| A New Sensing Metric to Reduce Data Fluctuations in a Nanogap-Embedded Field-Effect Transistor Biosensor Kim, Chang-Hoon; Ahn, Jae-Hyuk; Lee, Kyung-Bok; Jung, Cheul-Hee; Park, Hyun-Gyu; Choi, Yang-Kyu, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.59, no.10, pp.2825 - 2831, 2012-10 |
| A Proactive Plastic Deformation Method for Fine-Tuning of Metal-Based MEMS Devices After Fabrication Yoon, Yong Hoon; Han, Chang-Hoon; Lee, Jae Shin; Yoon, Jun-Bo, JOURNAL OF MICROELECTROMECHANICAL SYSTEMS, v.27, no.6, pp.1124 - 1134, 2018-12 |
| A study of negative-bias temperature instability of SOI and body-tied FinFETs Lee, HJ; Lee, CH; Park, DG; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.26, no.5, pp.326 - 328, 2005-05 |
| An Extremely Low Contact-Resistance MEMS Relay Using Meshed Drain Structure and Soft Insulating Layer Song, Yong-Ha; Choi, Dong-Hoon; Yang, Hyun-Ho; Yoon, Jun-Bo, JOURNAL OF MICROELECTROMECHANICAL SYSTEMS, v.20, no.1, pp.204 - 212, 2011-02 |
| Anode-Patterned Monorail-Structure Fiber-Based Organic Light-Emitting Diodes with Long Lifetime and High Performance for Truly Wearable Displays Kong, Seong Uk; Jeon, Yongmin; Lee, Ho Seung; Hwang, Yong Ha; Chang, Jaehyeock; Kim, Hagseon; Kim, Chan Young; et al, ADVANCED OPTICAL MATERIALS, v.11, no.13, 2023-07 |
| Bias and thermal annealings of radiation-induced leakage currents in thin-gate oxides Ang, CH; Ling, CH; Cheng, ZY; Kim, SJ; Cho, Byung Jin, IEEE TRANSACTIONS ON NUCLEAR SCIENCE, v.47, no.6, pp.2764 - 4, 2000-12 |
| Charge trapping and breakdown mechanism in HfAIO/TaN gate stack analyzed using carrier separation Loh, WY; Cho, Byung Jin; Joo, MS; Li, MF; Chan, DSH; Mathew, S; Kwong, DL, IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, v.4, no.4, pp.696 - 703, 2004-12 |
| Complementary Dual-Contact Switch Using Soft and Hard Contact Materials for Achieving Low Contact Resistance and High Reliability Simultaneously Song, Yong-Ha; Kim, Min-Wu; Lee, Jeong Oen; Ko, Seung-Deok; Yoon, Jun-Bo, JOURNAL OF MICROELECTROMECHANICAL SYSTEMS, v.22, no.4, pp.846 - 854, 2013-08 |
| Curing of Aged Gate Dielectric by the Self-Heating Effect in MOSFETs Park, Jun-Young; Moon, Dong-Il; Lee, Geon-Beom; Choi, Yang-Kyu, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.67, no.3, pp.777 - 788, 2020-03 |
| Curing of Hot-Carrier Induced Damage by Gate-Induced Drain Leakage Current in Gate-All-Around FETs Park, Jun-Young; Yun, Dae-Hwan; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.40, no.12, pp.1909 - 1912, 2019-12 |
| Demonstration of a Curable Nanowire FinFET Using Punchthrough Current to Repair Hot-Carrier Damage Park, Jun-Young; Hur, Jae; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.39, no.2, pp.180 - 183, 2018-02 |
| Detection of a Nanoscale Hot Spot by Hot Carriers in a Poly-Si TFT Using Polydiacetylene-Based Thermoresponsive Fluorometry Choi, Ji-Min; Choi, Sung-Jin; Yarimaga, Oktay; Yoon, Bora; Kim, Jong-Man; Choi, Yang-Kyu, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.58, no.5, pp.1570 - 1574, 2011-05 |
| Excellent Reliability and High-Speed Antiferroelectric HfZrO2 Tunnel Junction by a High-Pressure Annealing Process and Built-In Bias Engineering Goh, Youngin; Hwang, Junghyeon; Jeon, Sanghun, ACS APPLIED MATERIALS & INTERFACES, v.12, no.51, pp.57539 - 57546, 2020-12 |
| Hot carrier reliability study in body-tied fin-type field effect transistors Han, JW; Lee, CH; Park, D; Choi, Yang-Kyu, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, v.45, no.4B, pp.3101 - 3105, 2006-04 |
| Improved SOI FinFETs Performance with Low-Temperature Deuterium Annealing Ku, Ja-Yun; Yu, Ji-Man; Wang, Dong-Hyun; Jung, Dae-Han; Han, Joon-Kyu; Choi, Yang-Kyu; Park, Jun-Young, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.70, no.7, pp.3958 - 3962, 2023-07 |
| Improvement of Reliability of a Flexible Photoluminescent Display Using Organic-Based Materials Kim, Seung-Hun; Jang, Cheol; Kim, Kuk-Joo; Ahn, Sung-Il; Choi, Kyung-Cheol, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.57, pp.3370 - 3376, 2010-12 |
| Integration of a Carbon Nanotube Network on a Microelectromechanical Switch for Ultralong Contact Lifetime Jo, Eunhwan; Seo, Min-Ho; Pyo, Soonjae; Ko, Seung-Deok; Kwon, Dae-Sung; Choi, Jungwook; Yoon, Jun-Bo; et al, ACS APPLIED MATERIALS & INTERFACES, v.11, no.20, pp.18617 - 18625, 2019-05 |
| Integration of Gold Nanoparticle-Carbon Nanotube Composite for Enhanced Contact Lifetime of Microelectromechanical Switches with Very Low Contact Resistance Jo, Eunhwan; Lee, Yong-Bok; Jung, Yohan; Kim, Su-Bon; Kang, Yunsung; Seo, Min-Ho; Yoon, Jun-Bo; et al, ACS APPLIED MATERIALS & INTERFACES, v.13, no.14, pp.16959 - 16967, 2021-04 |
| Investigation of Self-Heating Effects in Gate-All-Around MOSFETs With Vertically Stacked Multiple Silicon Nanowire Channels Park, Jun-Young; Lee, Byung-Hyun; Chang, Ki Soo; Kim, Dong Uk; Jeong, Chanbae; Kim, Choong-Ki; Bae, Hagyoul; et al, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.64, no.11, pp.4393 - 4399, 2017-11 |
| Investigation of the Nanoparticle Electrical Contact Lubrication in MEMS Switches Ko, Seung-Deok; Seo, Min-Ho; Yoon, Yong Hoon; Han, Chang-Hoon; Lim, Keun Seo; Kim, Chang-Keun; Yoon, Jun-Bo, JOURNAL OF MICROELECTROMECHANICAL SYSTEMS, v.26, no.6, pp.1417 - 1427, 2017-12 |
| Localized oxide degradation in ultrathin gate dielectric and its statistical analysis Loh, WY; Cho, Byung Jin; Li, MF; Chan, DSH; Ang, CH; Zheng, JZ; Kwong, DL, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.50, no.4, pp.967 - 972, 2003-04 |
| On the Trade-Off Between Computational Load and Reliability for Network Function Virtualization Kang, Jinkyu; Simeone, Osvaldo; Kang, Joonhyuk, IEEE COMMUNICATIONS LETTERS, v.21, no.8, pp.1767 - 1770, 2017-08 |
| Power Reduction in Punch-Through Current-Based Electro-Thermal Annealing in Gate-All-Around FETs Kim, Min-Kyeong; Choi, Yang-Kyu; Park, Jun-Young, MICROMACHINES, v.13, no.1, 2022-01 |
| Radiation and electrical stress-induced hole trap-assisted tunneling currents in ultrathin gate oxides Ang, CH; Ling, CH; Cho, Byung Jin; Kim, SJ; Cheng, ZY, SOLID-STATE ELECTRONICS, v.44, no.11, pp.2001 - 2007, 2000-11 |
| Reliability of High Dielectric Ba0.5Sr0.5TiO3 Capacitors Using Iridium Electrode Lee, Hee Chul; S.Y.Cha; B.T.Jang, INTEGRATED FERROELECTRICS, v.24, no.1-4, pp.45 - 55, 1999-01 |
| RF, DC, and reliability characteristics of ALD HfO2-Al2O3 laminate MIM capacitors for Si RF IC applications Ding, SJ; Hu, H; Zhu, CX; Kim, SJ; Yu, XF; Li, MF; Cho, Byung Jin; et al, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.51, no.6, pp.886 - 894, 2004-06 |
| Self-Curable Gate-All-Around MOSFETs Using Electrical Annealing to Repair Degradation Induced From Hot-Carrier Injection Park, Jun-Young; Moon, Dong-Il; Seol, Myeong-Lok; Kim, Choong-Ki; Jeon, Chang-Hoon; Bae, Hagyoul; Bang, Tewook; et al, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.63, no.3, pp.910 - 915, 2016-03 |
| Self-Heating Effects in 3-D Vertical-NAND (V-NAND) Flash Memory Yun, Gyeong-Jun; Yun, Dae-Hwan; Park, Jun-Young; Kim, Seong-Yoen; Choi, Yang-Kyu, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.67, no.12, pp.5505 - 5510, 2020-12 |
| Significance of gate oxide thinning below 1.5 nm on 1/f noise behavior in n-channel metal-oxide-semiconductor field-effect transistors under electrical stress Mheen, B; Kim, M; Song, YJ; Hong, Songcheol, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, v.45, no.6A, pp.4943 - 4947, 2006-06 |
| Suppression of Self-Heating Effects in 3-D V-NAND Flash Memory Using a Plugged Pillar-Shaped Heat Sink Park, Jun-Young; Yun, Dae-Hwan; Kim, Seong-Yeon; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.40, no.2, pp.212 - 215, 2019-02 |
| Transient bit error recovery scheme for ROM-based embedded systems Ryu, Sang-Moon; Park, Dong-Jo, IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS, v.E88D, no.9, pp.2209 - 2212, 2005-09 |
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