Browse "EE-Journal Papers(저널논문)" by Author Lee, Geon-Beom
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A Comparative Study of the Curing Effects of Local and Global Thermal Annealing on a FinFET Park, Jun-Young; Lee, Geon-Beom; Choi, Yang-Kyu, IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY, v.7, no.1, pp.954 - 958, 2019-08 |
| A Novel Charge Pumping Technique With Gate-Induced Drain Leakage Current Lee, Geon-Beom; Kim, Jeong-Yeon; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.44, no.5, pp.709 - 712, 2023-05 |
| A Novel Technique for Curing Hot-CarrierInduced Damage by Utilizing the Forward Current of the PN-Junction in a MOSFET Lee, Geon-Beom; Kim, Choong-Ki; Park, Jun-Young; Bang, Tewook; Bae, Hagyoul; Kim, Seong-Yeon; Ryu, Seung-Wan; et al, IEEE ELECTRON DEVICE LETTERS, v.38, no.8, pp.1012 - 1014, 2017-08 |
| A Steep-Slope Phenomenon by Gate Charge Pumping in a MOSFET Kim, Myung-Su; Yun, Gyeong-Jun; Kim, Wu-Kang; Seo, Myungsoo; Kim, Da-Jin; Yu, Ji-Man; Han, Joon-Kyu; et al, IEEE ELECTRON DEVICE LETTERS, v.43, no.4, pp.521 - 524, 2022-04 |
| A Strategy for Optimizing Low Operating Voltage in a Silicon Biristor Son, Jun-Woo; Hur, Jae; Kim, Wu-Kang; Lee, Geon-Beom; Choi, Yang-Kyu, IEEE TRANSACTIONS ON NANOTECHNOLOGY, v.19, pp.5 - 10, 2020-01 |
| A Temperature Sensor With a Thermillator Lee, Mun-Woo; Han, Joon-Kyu; Yun, Gyeong-Jun; Yu, Ji-Man; Lee, Geon-Beom; Han, Seong-Joo; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.42, no.11, pp.1654 - 1657, 2021-09 |
| Analysis of Damage Curing in a MOSFET with Joule Heat Generated by Forward Junction Current at the Source and Drain Lee, Geon-Beom; Kim, Choong-Ki; Bang, Tewook; Yoo, Min-Soo; Park, Jun-Young; Choi, Yang-Kyu, MICROELECTRONICS RELIABILITY, v.104, 2020-01 |
| Concealable Oscillation-Based Physical Unclonable Function with a Single-Transistor Latch Jung, Jin-Woo; Han, Joon-Kyu; Yu, Ji-Man; Lee, Mun-Woo; Kim, Moon-Seok; Lee, Geon-Beom; Yun, Seong-Yun; et al, IEEE ELECTRON DEVICE LETTERS, v.43, no.8, pp.1359 - 1362, 2022-08 |
| Curing of 1-Transistor-DRAM by Joule Heat From Punch-Through Current Kim, Hyun-Jung; Lee, Geon-Beom; Han, Joon-Kyu; Han, Seong-Joo; Kim, Da-Jin; Yu, Ji-Man; Kim, Myung-Su; et al, IEEE ELECTRON DEVICE LETTERS, v.43, no.3, pp.370 - 373, 2022-03 |
| Curing of Aged Gate Dielectric by the Self-Heating Effect in MOSFETs Park, Jun-Young; Moon, Dong-Il; Lee, Geon-Beom; Choi, Yang-Kyu, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.67, no.3, pp.777 - 788, 2020-03 |
| Demonstration of Thermally-Assisted Programming with High Speed and Improved Reliability for Junctionless Nanowire NOR Flash Memory Yu, Ji-Man; Park, Jun-Young; Lee, Geon-Beom; Han, Joon-Kyu; Kim, Myung-Su; Hur, Jae; Yun, Dae-Hwan; et al, IEEE TRANSACTIONS ON NANOTECHNOLOGY, v.18, pp.1110 - 1113, 2019-10 |
| Effect of Off-state Stress on Gate-Induced Drain Leakage by Interface Traps in Buried-Gate FETs Lee, Geon-Beom; Kim, Choong-Ki; Yoo, Min-Soo; Hur, Jae; Choi, Yang-Kyu, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.66, no.12, pp.5126 - 5132, 2019-11 |
| High-Performance Field-Effect Transistor and Logic Gates Based on GaS-MoS(2 )van der Waals Heterostructure Shin, Gwang Hyuk; Lee, Geon-Beom; An, Eun-Su; Park, Cheolmin; Jin, Hyeok Jun; Lee, Khang June; Oh, Dong-Sik; et al, ACS APPLIED MATERIALS & INTERFACES, v.12, no.4, pp.5106 - 5112, 2020-01 |
| Highly Biased Linear Condition Method for Separately Extracting Source and Drain Resistance in MOSFETs Kim, Gun-Hee; Bae, Hagyoul; Hur, Jae; Kim, Choong-Ki; Lee, Geon-Beom; Bang, Tewook; Son, Yoon-Ik; et al, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.65, no.2, pp.419 - 423, 2018-02 |
| Hybrid Gate Dielectric of MoS2 Transistors for Enhanced Photo-Electronic Stability Park, Hamin; Oh, Dong Sik; Hong, Woonggi; Kang, Juyeon; Lee, Geon-Beom; Shin, Gwang Hyuk; Choi, Yang-Kyu; et al, ADVANCED MATERIALS INTERFACES, v.8, no.14, pp.2100599, 2021-07 |
| Improved Self-Curing Effect in a MOSFET with Gate Biasing Lee, Geon-Beom; Jung, Jin-Woo; Kim, Choong-Ki; Bang, Tewook; Yoo, Min-Soo; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.42, no.12, pp.1731 - 1734, 2021-12 |
| Lateral profiling of gate dielectric damage by off-state stress and positive-bias temperature instability Lee, Geon-Beom; Kim, Choong-Ki; Bang, Tewook; Yoo, Min-Soo; Choi, Yang-Kyu, MICROELECTRONICS AND RELIABILITY, v.127, pp.114383, 2021-12 |
| Localized Electrothermal Annealing with Nanowatt Power for a Silicon Nanowire Field-Effect Transistor Park, Jun-Young; Lee, Byung-Hyun; Lee, Geon-Beom; Bae, Hagyoul; Choi, Yang-Kyu, ACS APPLIED MATERIALS & INTERFACES, v.10, no.5, pp.4838 - 4843, 2018-02 |
| Low-Frequency Noise Characteristics Under the OFF-State Stress Lee, Geon-Beom; Kim, Choong-Ki; Yoo, Min-Soo; Choi, Yang-Kyu, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.67, no.10, pp.4366 - 4371, 2020-10 |
| Mimicry of Excitatory and Inhibitory Artificial Neuron with Leaky Integrate-and-Fire Function by a Single MOSFET Han, Joon-Kyu; Seo, Myungsoo; Kim, Wu-Kang; Kim, Moon-Seok; Kim, Seong-Yeon; Kim, Myung-Su; Yun, Gyeong-Jun; et al, IEEE ELECTRON DEVICE LETTERS, v.41, no.2, pp.208 - 211, 2020-02 |
| Mnemonic-Opto-Synaptic Transistor for In-sensor Vision System Han, Joon-Kyu; Chung, Young-Woo; Sim, Jaeho; Yu, Ji-Man; Lee, Geon-Beom; Kim, Sang-Hyeon; Choi, Yang-Kyu, SCIENTIFIC REPORTS, v.12, no.1, 2022-02 |
| Multi-functional logic circuits composed of ultra-thin electrolyte-gated transistors with wafer-scale integration Yu, Ji-Man; Lee, Chungryeol; Han, Joon-Kyu; Han, Seong-Joo; Lee, Geon-Beom; Im, Sung Gap; Choi, Yang-Kyu, JOURNAL OF MATERIALS CHEMISTRY C, v.9, no.22, pp.7222 - 7227, 2021-06 |
| Nano-electromechanical Switch Based on a Physical Unclonable Function for Highly Robust and Stable Performance in Harsh Environments Hwang, Kyu-Man; Park, Jun-Young; Bae, Hagyoul; Lee, Seung-Wook; Kim, Choong-Ki; Seo, Myungsoo; Im, Hwon; et al, ACS NANO, v.11, no.12, pp.12547 - 12552, 2017-12 |
| Quantitative Analysis of Deuterium Annealing Effect on Poly-Si TFTs by Low Frequency Noise and DC I-V Characterization Kim, Dohyun; Lim, Sung Kwan; Bae, Hagyoul; Kim, Choong-Ki; Lee, Seung-Wook; Seo, Myungsoo; Kim, Seong-Yeon; et al, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.65, no.4, pp.1640 - 1644, 2018-04 |
| Reliability Improvement of Gate-All-Around SONOS Memory by Joule Heat From Gate-Induced Drain Leakage Current Lee, Jung-Woo; Han, Joon-Kyu; Yu, Ji-Man; Lee, Geon-Beom; Tcho, Il-Woong; Choi, Yang-Kyu, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.69, no.1, pp.115 - 119, 2022-01 |
| Si-MoS2 Vertical Heterojunction for Photodetector with High Responsivity and Low Noise Equivalent Power Shin, Gwang Hyuk; Park, Jung Hoon; Lee, Khang June; Lee, Geon-Beom; Jeon, Hyun Bae; Choi, Yang-Kyu; Yu, Kyoungsik; et al, ACS APPLIED MATERIALS & INTERFACES, v.11, no.7, pp.7626 - 7634, 2019-01 |
| Synaptic Segmented Transistor with Improved Linearity by Schottky Junctions and Accelerated Speed by Double-Layered Nitride Kim, Seong-Yeon; Yu, Ji-Man; Lee, Gi Sung; Yun, Dae-Hwan; Kim, Moon-Seok; Kim, Jin-Ki; Kim, Da-Jin; et al, ACS APPLIED MATERIALS & INTERFACES, v.14, no.28, pp.32261 - 32269, 2022-07 |
| Ternary logic decoder using independently controlled double-gate Si-NW MOSFETs Han, Seong-Joo; Han, Joon-kyu; Kim, Myung-Su; Yun, Gyeong-Jun; Yu, Ji-Man; Tcho, Il-Woong; Seo, Myungsoo; et al, SCIENTIFIC REPORTS, v.11, no.1, pp.13018, 2021-06 |
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