Browse "Dept. of Materials Science and Engineering(신소재공학과)" by Title
Showing results 5681 to 5700 of 19454
| Electromagnetic metamaterials with bespoke impedance = 임피던스를 자유로이 제어할 수 있는 전자기파 메타물질link Heo, Minsung; Shin, Jong Hwa; et al, 한국과학기술원, 2019 |
| Electromagnetic Shielding of Monolayer MXene Assemblies Yun, Taeyeong; Kim, Hyerim; Iqbal, Aamir; Cho, Yong Soo; Lee, Gang San; Kim, Myung-Ki; Kim, Seon Joon; et al, ADVANCED MATERIALS, v.32, no.9, 2020-03 |
| Electromigration in Flip Chip Solder Bump of 97Pb-3Sn/37Pb-63Sn Combination Structure Nah, JW; Kim, JH; Paik, Kyung-Wook; Lee, HM, TMS 2004 133rd Annual Meeting & Exhibition, pp.294, 133rd TMS Annual Meeting, 2004-03 |
| Electromigration in flip chip solder bump of 97Pb-3Sn/37Pb-63Sn combination structure Nah, JW; Kim, JH; Lee, HyuckMo; Paik, Kyung-Wook, ACTA MATERIALIA, v.52, no.1, pp.129 - 136, 2004-01 |
| Electromigration in Flip Chip Solder Bump of 97Pb-3Sn/37Pb-63Sn Combination Structure Nah, Jae-Woong; Kim, Jong Hoon; Lee, Hyuck-Mo; Paik, Kyung-Wook, 133rd TMS Annual Meeting, 133rd TMS Annual Meeting, 2004-03 |
| Electromigration induced Kirkendall void growth in Sn-3.5Ag/Cu solder joints Jung, Yong; Yu, Jin, JOURNAL OF APPLIED PHYSICS, v.115, no.8, 2014-02 |
| Electromigration model for the prediction of lifetime based on the failure unit statistics in aluminum metallization Park, JH; Ahn, Byung Tae, JOURNAL OF APPLIED PHYSICS, v.93, no.2, pp.883 - 892, 2003-01 |
| Electromigration of Pb-free solder flip chip using electroless Ni-P/Au UBM Kwon, YM; Paik, Kyung-Wook, International Conference on Electronic Materials and Packaging, EMAP 2006, 123, 2006-12-11 |
| Electromigration of Pb-free solder flip chip using electroless Ni-P/Au UBM Kwon, YM; Paik, Kyung-Wook, 57th Electronic Components and Technology Conference, ECTC '07, pp.1472 - 1477, IEEE, 2007-05-29 |
| Electromigration Performance of Pb-free Solder Joints in Terms of Solder Composition and Joining Path Seo, Sun-Kyoung; Kang, Sung K.; Cho, Moon Gi; Lee, HyuckMo, JOM, v.62, no.7, pp.22 - 29, 2010-07 |
| Electromigration Reliability of Barrierless Ruthenium and Molybdenum for Sub-10 nm Interconnection Kim, Jungkyun; Rhee, Hakseung; Son, Myeong Won; Park, Juseong; Kim, Gwangmin; Song, Hanchan; Kim, Geunwoo; et al, ACS APPLIED ELECTRONIC MATERIALS, v.5, no.5, pp.2447 - 2453, 2023-04 |
| Electron beam induced degradation of CaS : Pb thin film phosphor grown by atomic layer deposition Yun, SJ; Park, SHK; Park, JB, ELECTROCHEMICAL AND SOLID STATE LETTERS, v.6, no.2, pp.30 - 32, 2003-02 |
| Electron beam induced isotropic decomposition of nano ice = 전자빔에 의한 나노 얼음의 등방적 분해link Park, Jisu; Yuk, Jong Min; et al, 한국과학기술원, 2019 |
| Electron holography study for two-dimensional dopant profile measurement with specimens prepared by backside ion milling Yoo, Jung Ho; Yang, Jun-Mo; Ulugbek, Shaislamov; Ahn, Chi Won; Hwang, Wook-Jung; Park, Joong Keun; Park, Chul Min; et al, JOURNAL OF ELECTRON MICROSCOPY, v.57, no.1, pp.13 - 18, 2008-01 |
| Electron microscopy observation of resistive switching mechanism in graphene oxide memory = 전자현미경을 이용한 그래핀 산화물 메모리의 저항변화 메커니즘 연구link Kim, Sung Kyu; 김성규; et al, 한국과학기술원, 2016 |
| Electron Mobility in Surface- and Buried-Channel Flatband In0.53Ga0.47As MOSFETs With ALD Al2O3 Gate Dielectric Bentley, Steven J.; Holland, Martin; Li, Xu; Paterson, Gary W.; Zhou, HP; Ignatova, Olesya; Thoms, Stephen; et al, IEEE ELECTRON DEVICE LETTERS, v.32, no.4, pp.494 - 496, 2011-04 |
| Electron transport in high quality undoped ZnO film grown by plasma-assisted molecular beam epitaxy Jung, Yeon Sik; Kononenko, OV; Choi, WK, SOLID STATE COMMUNICATIONS, v.137, no.9, pp.474 - 477, 2006-03 |
| Electron transport properties in magnetic tunnel junctions with epitaxial NiFe (111) ferromagnetic bottom electrodes Yu, JH; Lee, HyuckMo; Ando, Y; Miyazaki, T, APPLIED PHYSICS LETTERS, v.82, no.26, pp.4735 - 4737, 2003-06 |
| Electron-Beam-Induced Formation of Oxygen Vacancies in Epitaxial LaCoO<sub>3</sub> Thin Films Yoo, Seung Jo; Yun, Tae Gyu; Jang, Jae Hyuck; Lee, Ji-Hyun; Park, Changhyun; Chung, Sung-Yoon, ELECTRONIC MATERIALS LETTERS, v.20, no.4, 2024-07 |
| Electron-beam-induced formation of Zn nanocrystal islands in a SiO2 layer Kim, TW; Shin, JW; Lee, JeongYong; Jung, JH; Lee, JW; Choi, WK; Jin, S, APPLIED PHYSICS LETTERS, v.90, no.5, pp.153 - 157, 2007-01 |
Discover
Open Access
Date issued
- 2,229 2020 - 2024
- 6,675 2010 - 2019
- 5,356 2000 - 2009
- 3,582 1990 - 1999
- 982 1980 - 1989