Browse "EE-Journal Papers(저널논문)" by Author Lee, Hee Chul

Showing results 31 to 90 of 120

31
Deoxidization of iridium oxide thin film

Cha, SY; Lee, Hee Chul, JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, v.38, no.10A, pp.1128 - 1130, 1999-10

32
Dependence of hydrogen and oxygen incorporation on deposition parameters in photochemical vapor deposited mercury free silicon nitride films

Sahu, BS; Srivastava, P; Agnihotri, OP; Lee, Hee Chul; Sekhar, BR; Mahapatra, S, THIN SOLID FILMS, v.446, pp.23 - 28, 2004-01

33
Design and implementation of infrared readout circuit using a new input circuit of current mirroring direct injection (CMDI)

Yoon, N.; Kim, B.; Lee, Hee Chul; Kim, C., OPTO-ELECTRONICS REVIEW, v.7, no.4, pp.321 - 326, 1999

34
Design of a Readout Circuit for Improving the SNR of Satellite Infrared Time Delay and Integration Arrays

Kim, Chul Bum; Woo, Doo Hyung; Lee, Hee Chul, IEICE TRANSACTIONS ON ELECTRONICS, v.E95C, no.8, pp.1406 - 1414, 2012-08

35
Design of a Smart CMOS Readout Circuit for Panoramic X-Ray Time Delay and Integration Arrays

Kim, Chul Bum; Woo, Doo Hyung; Kim, Byung Hyuk; Lee, Hee Chul, IEICE TRANSACTIONS ON ELECTRONICS, v.E94C, no.7, pp.1212 - 1219, 2011-07

36
DETERMINATION OF CONDUCTION-BAND TAIL AND FERMI ENERGY OF HEAVILY SI-DOPED GAAS BY ROOM-TEMPERATURE PHOTOLUMINESCENCE

LEE, NY; LEE, KJ; LEE, C; KIM, JE; PARK, HY; KWAK, DH; Lee, Hee Chul; et al, JOURNAL OF APPLIED PHYSICS, v.78, no.5, pp.3367 - 3370, 1995-09

37
DISTRIBUTION OF INTERFACIAL AS ATOMS IN THE ELECTRON-BEAM EXPOSURE AND EPITAXY (EBE-EPITAXY) TECHNIQUE FOR GROWING GAAS FILMS ON CAF2/SI(111) STRUCTURES

Lee, Hee Chul; ISHIWARA, H; FURUKAWA, S; SAIKI, K; KOMA, A, APPLIED SURFACE SCIENCE, v.41-2, pp.553 - 558, 1989-11

38
Dummy Gate-Assisted n-MOSFET Layout for a Radiation-Tolerant Integrated Circuit

Lee, Min Su; Lee, Hee Chul, IEEE TRANSACTIONS ON NUCLEAR SCIENCE, v.60, no.4, pp.3084 - 3091, 2013-08

39
Effect of rapid thermal annealing on the interface trap density between Pt and (Ba,Sr)TiO3 thin film

Kwak, DH; Jang, BT; Cha, SY; Lee, JS; Lee, Hee Chul, INTEGRATED FERROELECTRICS, v.17, no.1-4, pp.179 - 186, 1997

40
Effect of sputtering pressure on microstructure and bolometric properties of Nb: TiO2-x films for infrared image sensor applications

Reddy, Y. Ashok Kumar; Shin, Young Bong; Kang, In-Ku; Lee, Hee Chul, JOURNAL OF APPLIED PHYSICS, v.119, no.4, 2016-01

41
Effect of substrate temperature on polycrystalline Cd0.9Zn0.1Te thin films studied by Raman scattering spectroscopy

Sridharan, M; Mekaladevi, M; Narayandass, SK; Mangalaraj, D; Lee, Hee Chul, CRYSTAL RESEARCH AND TECHNOLOGY, v.39, pp.328 - 332, 2004-04

42
Effects of hydrazine surface treatment on HgCdTe long-wavelength infrared photodiodes

Lee, MY; Lee, YS; Lee, Hee Chul, JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS EXPRESS LETTERS, v.44, no.37-41, pp.1252 - 1255, 2005

43
Effects of Ir electrodes on the dielectric constants of Ba0.5Sr0.5TiO3 films

Cha, SY; Jang, BT; Lee, Hee Chul, JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, v.38, no.1AB, pp.49 - 51, 1999-01

44
ELECTRON-BEAM EXPOSURE (EBE) AND EPITAXY OF GAAS FILMS ON CAF2/SI STRUCTURES

Lee, Hee Chul; ASANO, T; ISHIWARA, H; FURUKAWA, S, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS, v.27, no.9, pp.1616 - 1625, 1988-09

45
Enhanced bolometric properties of nickel oxide thin films for infrared image sensor applications by substitutional incorporation of Li

Kang, In-Ku; Reddy, Y. Ashok Kumar; Shin, Young Bong; Kim, Woo Young; Lee, Hee Chul, CERAMICS INTERNATIONAL, v.44, no.7, pp.7808 - 7813, 2018-05

46
Enhanced bolometric properties of TiO2-x thin films by thermal annealing

Reddy, Y. Ashok Kumar; Shin, Young Bong; Kang, In-Ku; Lee, Hee Chul; Reddy, P. Sreedhara, APPLIED PHYSICS LETTERS, v.107, no.2, 2015-07

47
Enhancement of the saturation mobility in a ferroelectric-gated field-effect transistor by the surface planarization of ferroelectric film

Kim, Woo Young; Jeon, Gwang-Jae; Kang, In-Ku; Shim, Hyun Bin; Lee, Hee Chul, THIN SOLID FILMS, v.591, pp.1 - 7, 2015-09

48
Enhancement of the steady state minority carrier lifetime in HgCdTe photodiode using ECR plasma hydrogenation

Jung, H; Lee, Hee Chul; Kim, Choong Ki, JOURNAL OF ELECTRONIC MATERIALS, v.25, no.8, pp.1266 - 1269, 1996-08

49
Etching behavior and damage recovery of SrBi2Ta2O9 thin films

Lee, WJ; Cho, CR; Kim, SH; You, IK; Kim, BW; Yu, BG; Shin, CH; et al, JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, v.38, no.12A, pp.1428 - 1431, 1999-12

50
Fabrication and characterization of MFISFET using Al2O3 insulating layer for non-volatile memory

Shin, CH; Cha, SY; Lee, Hee Chul; Lee, WJ; Yu, BG; Kwak, DH, INTEGRATED FERROELECTRICS, v.34, no.1-4, pp.1553 - 1560, 2001

51
FORMATION OF GAAS-ON-INSULATOR STRUCTURES ON SI SUBSTRATES BY HETEROEPITAXIAL GROWTH OF CAF2 AND GAAS

ASANO, T; ISHIWARA, H; Lee, Hee Chul; TSUTSUI, K; FURUKAWA, S, JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, v.25, no.2, pp.139 - 141, 1986-02

52
HgCdTe-MISFET fabrication with multi-step surface passivation and quantum effects

Lee, CH; Paik, SW; Park, JW; Lee, J; Moon, YM; Choi, JB; Jung, H; et al, JOURNAL OF ELECTRONIC MATERIALS, v.27, no.6, pp.668 - 671, 1998-06

53
High injection efficiency readout circuit for low resistance infra-red detector

Yoon, N; Kim, B; Lee, Hee Chul; Kim, CK, ELECTRONICS LETTERS, v.35, no.18, pp.1507 - 1508, 1999-09

54
High-Dynamic-Range ROIC With Asynchronous Self-Controlled Two-Gain Modes for MWIR Focal Plane Arrays

Kim, Chiyeon; Woo, Doo Hyung; Lee, Hee Chul, IEEE SENSORS JOURNAL, v.19, no.2, pp.615 - 622, 2019-01

55
Hydrogenation of ZnS passivation on narrow-band gap HgCdTe

White, JK; Musca, CA; Lee, Hee Chul; Faraone, L, APPLIED PHYSICS LETTERS, v.76, no.17, pp.2448 - 2450, 2000-04

56
Hysteresis analysis in capacitance-voltage characteristics of Pt/(Ba,Sr)TiO3/Pt structures

Kwak, DH; Jang, BT; Cha, SY; Lee, SH; Lee, Hee Chul; Yu, BG, INTEGRATED FERROELECTRICS, v.13, no.1-3, pp.413 - 419, 1996

57
Improvement of dielectric properties by inserting oxygen-rich initial layer in Pt/(Ba,Sr)TiO3/Pt structure

Kwak, DH; Lee, SH; Jang, BT; Cha, SY; Lee, Hee Chul, INTEGRATED FERROELECTRICS, v.20, no.1-4, pp.205 - 214, 1998

58
Improvement of the thermal stability of Nb:TiO2-x samples for uncooled infrared detectors

Reddy, Y. Ashok Kumar; Kang, In-Ku; Shin, Young Bong; Lee, Hee Chul, JOURNAL OF PHYSICS D-APPLIED PHYSICS, v.51, no.2, 2018-01

59
In-pixel edge detection circuit without non-uniformity correction for an infrared focal plane array (IRFPA)

Kiw, CB; Woo, DH; Lee, Yong Soo; Lee, Hee Chul, IEICE TRANSACTIONS ON ELECTRONICS, v.E91C, pp.235 - 239, 2008-02

60
Influence of Nb Doping Concentration on Bolometric Properties of RF Magnetron Sputtered Nb:TiO2-x Films

Reddy, Y. Ashok Kumar; Shin, Young Bong; Kang, In-Ku; Lee, Hee Chul, JOURNAL OF ELECTRONIC MATERIALS, v.47, no.3, pp.2171 - 2176, 2018-03

61
Influence of passivation layer on thermal stability of Nb:TiO2-x samples for shutter-less infrared image sensors

Reddy, Y. Ashok Kumar; Ajitha, B.; Shin, Young Bong; Kang, In-Ku; Lee, Hee Chul, INFRARED PHYSICS & TECHNOLOGY, v.100, pp.52 - 56, 2019-08

62
Influence of thermal annealing on the structural and optical properties of polycrystalline Cd0.96Zn0.04Te thin films

Sridharan, MG; Narayandass, SK; Mangalaraj, D; Lee, Hee Chul, JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, v.7, pp.1483 - 1491, 2005-06

63
Influence of TiO2 adhesion layer thickness on properties of (Ba,Sr)TiO3 thin films

Kim, YJ; Lee, YS; Lee, Hee Chul, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, v.44, pp.6167 - 6169, 2005-08

64
Iridium thin film as a bottom electrode for high dielectric (Ba,Sr)TiO3 capacitors

Cha, SY; Jang, BT; Kwak, DH; Shin, CH; Lee, Hee Chul, INTEGRATED FERROELECTRICS, v.17, no.1-4, pp.187 - 195, 1997

65
Layout Modification of a PD-SOI n-MOSFET for Total Ionizing Dose Effect Hardening

Roh, Young Tak; Lee, Hee Chul, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.66, no.1, pp.308 - 315, 2019-01

66
Local Electro-Thermal Annealing for Repair of Total Ionizing Dose-Induced Damage in Gate-All-Around MOSFETs

Park, Jun-Young; Moon, Dong-Il; Bae, Hagyoul; Roh, Young Tak; Seol, Myeong-Lok; Lee, Byung-Hyun; Jeon, Chang-Hoon; et al, IEEE ELECTRON DEVICE LETTERS, v.37, no.7, pp.843 - 846, 2016-07

67
Low Power Pixel-Level ADC Readout Circuit for an Amorphous Silicon-Based Microbolometer

Ha, Dong-Heon; Hwang, Chi Ho; Lee, Yong Soo; Lee, Hee Chul, IEICE TRANSACTIONS ON ELECTRONICS, v.E92C, pp.708 - 712, 2009-05

68
Low-Noise and Wide-Dynamic-Range ROIC With a Self-Selected Capacitor for SWIR Focal Plane Arrays

Kim, Yeong Seon; Woo, Doo Hyung; Jo, Young Min; Kang, Sang Gu; Lee, Hee Chul, IEEE SENSORS JOURNAL, v.17, no.1, pp.179 - 184, 2017-01

69
Measurement of the steady-state minority carrier diffusion length in a HgCdTe photodiode

Jung, H; Lee, Hee Chul; Kim, CK, JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, v.35, no.10B, pp.1321 - 1323, 1996-10

70
Microstructural Effects on Nickel Oxide Film Properties in an Infrared Electrochromic Window for Shutter-Less Infrared Sensor Application

Shim, Hyun Bin; Kim, Woo Young; Kang, In-Ku; Lee, Hee Chul, IEEE SENSORS JOURNAL, v.17, no.20, pp.6522 - 6528, 2017-10

71
Mismatch-tolerant read-in IC with voltage-drop compensation for infrared scene projectors

Shin, Uisub; Cho, Min Ji; Lee, Hee Chul, IEICE ELECTRONICS EXPRESS, v.15, no.11, 2018-06

72
MSM Photodetector on a Polysilicon Membrane for a Silicon-Based Wafer-Level Packaged LED

Kim, Jin Kwan; Lee, Hee Chul, IEEE PHOTONICS TECHNOLOGY LETTERS, v.25, no.24, pp.2462 - 2465, 2013-12

73
Multiple integration method for a high signal-to-noise ratio readout integrated circuit

Kang, SG; Woo, DH; Lee, Hee Chul, IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS, v.52, pp.553 - 557, 2005-09

74
Nanoporous Pirani sensor based on anodic aluminum oxide

Jeon, Gwang-Jae; Kim, Woo-Young; Shim, Hyun Bin; Lee, Hee Chul, APPLIED PHYSICS LETTERS, v.109, no.12, 2016-09

75
Nb doping effect on TiO2-x films for bolometer applications

Shin, Young Bong; Reddy, Y. Ashok Kumar; Kang, In-Ku; Lee, Hee Chul, JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, v.91, pp.128 - 135, 2016-04

76
New surface treatment method for improving the interface characteristics of CdTe/Hg1-xCdxTe heterostructure

Lee, SH; Shin, H; Lee, Hee Chul; Kim, CK, JOURNAL OF ELECTRONIC MATERIALS, v.26, no.6, pp.556 - 560, 1997-06

77
Noise bandwidth suppression for low noise readout circuit

Kim, B; Lee, Hee Chul, ELECTRONICS LETTERS, v.38, no.12, pp.558 - 560, 2002-06

78
Novel current-mode background suppression for 2-D LWIR applications

Woo, DH; Kang, SG; Lee, Hee Chul, IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS, v.52, pp.606 - 610, 2005-09

79
Novel two step background suppression for 2-D LWIR application

Woo, DH; Kang, SG; Lee, Hee Chul, IEICE TRANSACTIONS ON ELECTRONICS, v.E87C, pp.1649 - 1651, 2004-09

80
Optical and opto-electronic properties of polycrystalline Cd0.96Zn0.04Te thin films

Sridharan, M; Narayandass, SK; Mangalaraj, D; Lee, Hee Chul, CRYSTAL RESEARCH AND TECHNOLOGY, v.38, no.6, pp.479 - 487, 2003

81
Optical constants of vacuum-evaporated Cd0.96Zn0.04Te thin films measured by spectroscopic ellipsometry

Sridharan, M; Narayandass, SK; Mangalaraj, D; Lee, Hee Chul, JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, v.13, no.8, pp.471 - 476, 2002-08

82
OPTIMIZATION OF THE GROWTH-CONDITIONS OF HETEROEPITAXIAL GAAS FILMS ON CAF2/SI STRUCTURES

Lee, Hee Chul; ASANO, T; ISHIWARA, H; FURUKAWA, S, JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, v.25, no.7, pp.595 - 597, 1986-07

83
Optimum solution of on-chip A/D converter for cooled type infrared focal plane array

Kang, SG; Woo, DH; Lee, Hee Chul, IEICE TRANSACTIONS ON ELECTRONICS, v.E88C, pp.413 - 419, 2005-03

84
Oxygen Atmosphere Annealing Effect on the Thermal Stability of TiO2-x Based Films for Shutter-Less Infrared Image Sensors

Reddy, Y. Ashok Kumar; Kang, In-Ku; Shin, Young Bong; Lee, Hee Chul, Key Engineering Materials, v.775, pp.272 - 277, 2018-08

85
P-MOSFET latch-based monolithic signal-processing circuit for nuclear event detector

Kim, Tae-Hyo; Lee, Hee Chul; Woo, Doo Hyung, NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, v.904, pp.93 - 99, 2018-10

86
Photocurrent effect on the zero-bias dynamic resistance of HgCdTe photodiode

Kim, K; Jung, H; Shin, H; Lee, Hee Chul; Kim, CK, JOURNAL OF ELECTRONIC MATERIALS, v.26, no.6, pp.662 - 666, 1997-06

87
Pixel-Level ADC with Two-Step Integration for 2-D Microbolometer IRFPA

Hwang, Chi Ho; Woo, Doo Hyung; Lee, Hee Chul, IEICE TRANSACTIONS ON ELECTRONICS, v.E94C, no.12, pp.1909 - 1912, 2011-12

88
Pixelwise readout circuit with current mirroring injection for microbolometer FPAs

Hwang, C. H.; Kim, C. B.; Lee, Y. S.; Lee, Hee Chul, ELECTRONICS LETTERS, v.44, no.12, pp.732 - 121, 2008-06

89
Plasma induced type conversion in mercury cadmium telluride

Agnihotri, OP; Lee, Hee Chul; Yang, KD, SEMICONDUCTOR SCIENCE AND TECHNOLOGY, v.17, no.10, pp.11 - 19, 2002-10

90
Platinum bottom electrodes formed by electron-beam evaporation for high-dielectric thin films

Lee, Hee Chul; Kim, Ho Gi, JAPANESE JOURNAL OF APPLIED PHYSICS, v.34, no.9B, pp.5220 - 5223, 1995-01

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