Browse "EE-Journal Papers(저널논문)" by Author Lee, Hee Chul
Showing results 74 to 120 of 120
| Nanoporous Pirani sensor based on anodic aluminum oxide Jeon, Gwang-Jae; Kim, Woo-Young; Shim, Hyun Bin; Lee, Hee Chul, APPLIED PHYSICS LETTERS, v.109, no.12, 2016-09 |
| Nb doping effect on TiO2-x films for bolometer applications Shin, Young Bong; Reddy, Y. Ashok Kumar; Kang, In-Ku; Lee, Hee Chul, JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, v.91, pp.128 - 135, 2016-04 |
| New surface treatment method for improving the interface characteristics of CdTe/Hg1-xCdxTe heterostructure Lee, SH; Shin, H; Lee, Hee Chul; Kim, CK, JOURNAL OF ELECTRONIC MATERIALS, v.26, no.6, pp.556 - 560, 1997-06 |
| Noise bandwidth suppression for low noise readout circuit Kim, B; Lee, Hee Chul, ELECTRONICS LETTERS, v.38, no.12, pp.558 - 560, 2002-06 |
| Novel current-mode background suppression for 2-D LWIR applications Woo, DH; Kang, SG; Lee, Hee Chul, IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS, v.52, pp.606 - 610, 2005-09 |
| Novel two step background suppression for 2-D LWIR application Woo, DH; Kang, SG; Lee, Hee Chul, IEICE TRANSACTIONS ON ELECTRONICS, v.E87C, pp.1649 - 1651, 2004-09 |
| Optical and opto-electronic properties of polycrystalline Cd0.96Zn0.04Te thin films Sridharan, M; Narayandass, SK; Mangalaraj, D; Lee, Hee Chul, CRYSTAL RESEARCH AND TECHNOLOGY, v.38, no.6, pp.479 - 487, 2003 |
| Optical constants of vacuum-evaporated Cd0.96Zn0.04Te thin films measured by spectroscopic ellipsometry Sridharan, M; Narayandass, SK; Mangalaraj, D; Lee, Hee Chul, JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, v.13, no.8, pp.471 - 476, 2002-08 |
| OPTIMIZATION OF THE GROWTH-CONDITIONS OF HETEROEPITAXIAL GAAS FILMS ON CAF2/SI STRUCTURES Lee, Hee Chul; ASANO, T; ISHIWARA, H; FURUKAWA, S, JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, v.25, no.7, pp.595 - 597, 1986-07 |
| Optimum solution of on-chip A/D converter for cooled type infrared focal plane array Kang, SG; Woo, DH; Lee, Hee Chul, IEICE TRANSACTIONS ON ELECTRONICS, v.E88C, pp.413 - 419, 2005-03 |
| Oxygen Atmosphere Annealing Effect on the Thermal Stability of TiO2-x Based Films for Shutter-Less Infrared Image Sensors Reddy, Y. Ashok Kumar; Kang, In-Ku; Shin, Young Bong; Lee, Hee Chul, Key Engineering Materials, v.775, pp.272 - 277, 2018-08 |
| P-MOSFET latch-based monolithic signal-processing circuit for nuclear event detector Kim, Tae-Hyo; Lee, Hee Chul; Woo, Doo Hyung, NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, v.904, pp.93 - 99, 2018-10 |
| Photocurrent effect on the zero-bias dynamic resistance of HgCdTe photodiode Kim, K; Jung, H; Shin, H; Lee, Hee Chul; Kim, CK, JOURNAL OF ELECTRONIC MATERIALS, v.26, no.6, pp.662 - 666, 1997-06 |
| Pixel-Level ADC with Two-Step Integration for 2-D Microbolometer IRFPA Hwang, Chi Ho; Woo, Doo Hyung; Lee, Hee Chul, IEICE TRANSACTIONS ON ELECTRONICS, v.E94C, no.12, pp.1909 - 1912, 2011-12 |
| Pixelwise readout circuit with current mirroring injection for microbolometer FPAs Hwang, C. H.; Kim, C. B.; Lee, Y. S.; Lee, Hee Chul, ELECTRONICS LETTERS, v.44, no.12, pp.732 - 121, 2008-06 |
| Plasma induced type conversion in mercury cadmium telluride Agnihotri, OP; Lee, Hee Chul; Yang, KD, SEMICONDUCTOR SCIENCE AND TECHNOLOGY, v.17, no.10, pp.11 - 19, 2002-10 |
| Platinum bottom electrodes formed by electron-beam evaporation for high-dielectric thin films Lee, Hee Chul; Kim, Ho Gi, JAPANESE JOURNAL OF APPLIED PHYSICS, v.34, no.9B, pp.5220 - 5223, 1995-01 |
| Proposal of a ferroelectric multi-bit memory structure for reliable operation at sub-100 nm scale Kim, Woo-Young; Lee, Hee Chul, MICRO & NANO LETTERS, v.10, no.12, pp.700 - 702, 2015-12 |
| Radiation-hardened gate-around n-MOSFET structure for radiation-tolerant application-specific integrated circuits Lee, Min Su; Lee, Hee Chul, JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.61, no.10, pp.1670 - 1674, 2012-11 |
| Raman scattering studies on B+ implanted Cd0.96Zn0.04Te thin films Sridharan, M; Narayandass, SK; Mangalaraj, D; Lee, Hee Chul, VACUUM, v.68, no.2, pp.119 - 122, 2002-10 |
| Raman scattering studies on polycrystalline Cd0.9Zn0.1Te thin films Sridharan, MG; Mekaladevi, M; Narayandass, SK; Mangalaraj, D; Lee, Hee Chul, JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, v.7, pp.1479 - 1482, 2005-06 |
| Raman scattering, photoluminescence and spectroscopic ellipsometry studies on polycrystalline Cd0.96Zn0.04Te thin films Sridharan, M; Narayandass, SK; Mangalaraj, D; Lee, Hee Chul, JOURNAL OF ALLOYS AND COMPOUNDS, v.346, no.1-2, pp.100 - 106, 2002-11 |
| Rapid thermal diffusion of indium in p-HgCdTe/CdTe Park, SM; Kim, JM; Lee, Hee Chul; Kim, Choong Ki, JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, v.35, no.12A, pp.1554 - 1557, 1996-12 |
| Reliability of High Dielectric Ba0.5Sr0.5TiO3 Capacitors Using Iridium Electrode Lee, Hee Chul; S.Y.Cha; B.T.Jang, INTEGRATED FERROELECTRICS, v.24, no.1-4, pp.45 - 55, 1999-01 |
| Room-temperature photoreflectance and photoluminescence of heavily Si-doped GaAs Lee, Chul; Lee, Nam-Young; Lee, Kyu-Jang; Kim, Jae-Eun; Park, Hae Yong; Kwak, Dong-Hwa; Lee, Hee Chul; et al, Journal of Applied Physics, Vol.77, No.12, pp.6727-6729, 1995-06-15 |
| ROOM-TEMPERATURE PHOTOREFLECTANCE AND PHOTOLUMINESCENCE OF HEAVILY SI-DOPED GAAS LEE, C; LEE, NY; LEE, KJ; Kim, Jae Eun; Park, Hae-Yong; KWAK, DH; Lee, Hee Chul; et al, JOURNAL OF APPLIED PHYSICS, v.77, no.12, pp.6727 - 6729, 1995-06 |
| Selective lateral etching of Al0.3Ga0.7As/GaAs heterojunction structure using the redox solution of I-2/KI Kim, DH; Lee, Hee Chul, JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, v.36, no.3A, pp.253 - 255, 1997-03 |
| Smart Reset Control for Wide-Dynamic-Range LWIR FPAs Woo, DH; Nam, IK; Lee, Hee Chul, IEEE SENSORS JOURNAL, v.11, pp.131 - 136, 2011-01 |
| Smart TDI readout circuit for long-wavelength IR detector Kim, B; Lee, Hee Chul, ELECTRONICS LETTERS, v.38, no.16, pp.854 - 855, 2002-08 |
| Solution-processed conformal coating of ferroelectric polymer film and its application to multi-bit memory device Kim, Woo-Young; Shim, Hyun Bin; Jeon, Gwang-Jae; Kang, In-Ku; Lee, Hee Chul, MICROELECTRONIC ENGINEERING, v.160, pp.68 - 72, 2016-07 |
| Spectroscopic ellipsometry studies on polycrystalline Cd0.9Zn0.1Te thin films Sridharan, MG; Mekaladevi, M; Rodriguez-Viejo, J; Narayandass, SK; Mangalaraj, D; Lee, Hee Chul, PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, v.201, pp.782 - 790, 2004-03 |
| Sputtering pressure dependent bolometric properties of Ni1-xO thin films for uncooled bolometer applications Kang, In-Ku; Reddy, Y. Ashok Kumar; Shin, Young Bong; Kim, Woo Young; Lee, Hee Chul, CERAMICS INTERNATIONAL, v.43, no.12, pp.9498 - 9504, 2017-08 |
| Studies on polycrystalline Cd0.96Zn0.04Te thin films prepared by vacuum evaporation Sridharan, M; Narayandass, SK; Mangalaraj, D; Lee, Hee Chul, VACUUM, v.70, pp.511 - 522, 2003-04 |
| Substrate temperature dependent bolometric properties of TiO2-x films for infrared image sensor applications Reddy, Y. Ashok Kumar; Shin, Young Bong; Kang, In-Ku; Lee, Hee Chul, CERAMICS INTERNATIONAL, v.42, no.15, pp.17123 - 17127, 2016-11 |
| Surface leakage current analysis of ion implanted ZnS-passivated n-on-p HgCdTe diodes in weak inversion Kim, YH; Bae, SH; Lee, Hee Chul; Kim, CK, JOURNAL OF ELECTRONIC MATERIALS, v.29, no.6, pp.832 - 836, 2000-06 |
| Surface treatment effects on the electrical properties of the interfaces between ZnS and LPE-Grown Hg0.7Cd0.3Te Lee, Seong Hoon; Bae, Soo Ho; Lee, Hee Chul; Kim, Choong Ki, JOURNAL OF ELECTRONIC MATERIALS, v.27, no.6, pp.684 - 688, 1998-06 |
| Systematic Investigation on Deposition Temperature Effect of Ni1-xO Thin Films for Uncooled Infrared Image Sensor Applications Kang, In-Ku; Reddy, Y. Ashok Kumar; Shin, Young Bong; Lee, Hee Chul, IEEE SENSORS JOURNAL, v.15, no.12, pp.7234 - 7241, 2015-12 |
| Tailoring of the coercive voltage in a ferroelectric polymer capacitor Kim, Woo-Young; Lee, Hee Chul, MICROELECTRONIC ENGINEERING, v.166, pp.19 - 25, 2016-12 |
| THE EFFECT OF ELECTROCHEMICAL REDUCTION AND UV EXPOSURE IN H2S GAS ON INTERFACE PROPERTIES OF ZNS/P-HG1-XCDXTE JEONG, JH; Lee, Hee Chul; Kim, Choong Ki, JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, v.31, no.12B, pp.1785 - 1787, 1992-12 |
| Ti thickness effects in Pt/Ti bottom electrode on properties of (Ba,Sr)TiO3 thin film Cha, SY; Lee, SH; Lee, Hee Chul, INTEGRATED FERROELECTRICS, v.16, no.1-4, pp.183 - 190, 1997 |
| Time-based pixel-level ADC with wide dynamic range for 2-D LWIR applications Woo, DH; Hwang, CH; Lee, YS; Lee, Hee Chul, ELECTRONICS LETTERS, v.41, pp.782 - 783, 2005-07 |
| Total Ionizing Dose Effects on a 12-bit 40kS/s SAR ADC Designed With a Dummy Gate-Assisted n-MOSFET Kim, Tae-Hyo; Lee, Hee Chul, IEEE TRANSACTIONS ON NUCLEAR SCIENCE, v.64, no.1, pp.648 - 653, 2017-01 |
| Triple-Mode Read-In Integrated Circuit for Infrared Sensor Evaluation System Cho, Min Ji; Woo, Doo Hyung; Lee, Hee Chul, IEEE SENSORS JOURNAL, v.19, no.13, pp.5014 - 5021, 2019-07 |
| Ultraviolet photon induced bulk, surface and interface modifications in n-Hg0.8Cd0.2Te in hydrogen environment Agnihotri, OP; Pal, R; Yang, KD; Bae, SH; Lee, SJ; Lee, MY; Choi, WS; et al, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS, v.41, no.7A, pp.4500 - 4502, 2002-07 |
| Very Wide Dynamic Range ROIC With Pixel-Level ADC for SWIR FPAs Jo, Young Min; Woo, D. H.; Kang, S. G.; Lee, Hee Chul, IEEE SENSORS JOURNAL, v.16, no.19, pp.7227 - 7233, 2016-10 |
| X-ray diffraction and Raman scattering studies in B-10(+)-implanted Cd0.96Zn0.04Te thin films prepared by vacuum evaporation Sridharan, M; Narayandass, SK; Mangalaraj, D; Lee, Hee Chul, JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, v.14, pp.69 - 73, 2003-02 |
| 韓國 におけるHgCdTe技術 sooho bae; han jung; seung-man park; Lee, Hee Chul, JOURNAL OF THE JAPAN SOCIETY OF INFRARED SCIENCE AND TECHNOLOGY, v.18, no.2, pp.14 - 21, 2009-12 |
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