Showing results 15 to 74 of 120
Bake stability of CdTe and ZnS on HgCdTe: An x-ray photoelectron spectroscopy study Jha, SK; Srivastava, P; Pal, R; Anjali; Sehgal, HK; Lee, Hee Chul; Agnihotri, OP; et al, JOURNAL OF ELECTRONIC MATERIALS, v.32, no.8, pp.899 - 905, 2003-08 |
Behavior of elemental tellurium as surface generation-recombination centers in CdTe/HgCdTe interface Lee, MY; Lee, YS; Lee, Hee Chul, APPLIED PHYSICS LETTERS, v.88, pp.103 - 109, 2006-05 |
Bistable memory and logic-gate devices fabricated by intercrossed stacking of graphene-ferroelectric hybrid ribbons Kim, Woo-Young; Kim, Hyeon-Don; Jeon, Gwang-Jae; Kang, In-Ku; Shim, Hyun Bin; Kim, Tae-Hyo; Lee, Hee Chul, MICRO & NANO LETTERS, v.11, no.7, pp.356 - 359, 2016-07 |
Bolometric properties of oxygen atmosphere annealed Nb:TiO2-x films for infrared detectors Reddy, Y. Ashok Kumar; Kang, In-Ku; Shin, Young Bong; Lee, Hee Chul, CERAMICS INTERNATIONAL, v.43, no.12, pp.9207 - 9213, 2017-08 |
Bolometric properties of reactively sputtered TiO2-x films for thermal infrared image sensors Reddy, Y. Ashok Kumar; Kang, In-Ku; Shin, Young Bong; Lee, Hee Chul, JOURNAL OF PHYSICS D-APPLIED PHYSICS, v.48, no.35, 2015-09 |
Characterisation of ferroelectric poly(vinylidene fluoride-trifluoroethylene) film prepared by Langmuir-Blodgett deposition Kim, Woo Young; Song, Dong-Seok; Jeon, Gwang-Jae; Kang, In Ku; Shim, Hyun Bin; Kim, Do-Kyung; Lee, Hee Chul; et al, MICRO & NANO LETTERS, v.10, no.8, pp.384 - 388, 2015-08 |
Characteristics of gradually doped LWIR diodes by hydrogenation Kim, Y.-H.; Kim, T.-S.; Redfern, D.A.; Musca, C.A.; Lee, Hee Chul; Kim, Choong Ki, JOURNAL OF ELECTRONIC MATERIALS, v.29, no.6, pp.859 - 864, 2000-06 |
Characterization of the surface recombination velocity of HgCdTe using a gate-controlled diode Choi, JH; Lee, Hee Chul, JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, v.39, no.2B, pp.152 - 155, 2000-02 |
Characterization of vacuum evaporated polycrystalline Cd0.96Zn0.04Te thin films by XRD, Raman scattering and spectroscopic ellipsometry Sridharan, M; Narayandass, SK; Mangalaraj, D; Lee, Hee Chul, CRYSTAL RESEARCH AND TECHNOLOGY, v.37, no.9, pp.964 - 975, 2002 |
CMOS readout circuit allowing microbolometer arrays to operate without temperature stabilisation Kang, SG; Lee, YS; Lee, Hee Chul, ELECTRONICS LETTERS, v.40, pp.1459 - 1460, 2004-11 |
CMOS TDI readout circuit that improves SNR for satellite IR applications Kim, C. B.; Hwang, C. H.; Kim, B. H.; Lee, Y. S.; Lee, Hee Chul, ELECTRONICS LETTERS, v.44, no.5, pp.346 - 348, 2008-02 |
Concentration dependent electron distributions in heavily Si-doped GaAs Lee, NY; Kim, Jae Eun; Park, Hae Yong; Kwak, DH; Lee, Hee Chul; Lim, H, SOLID STATE COMMUNICATIONS, v.99, no.8, pp.571 - 575, 1996-08 |
Controllable electrical and physical breakdown of poly-crystalline silicon nanowires by thermally assisted electromigration Park, Jun-Young; Moon, Dong-Il; Seol, Myeong-Lok; Jeon, Chang-Hoon; Jeon, Gwang-Jae; Han, Jin-Woo; Kim, Choong-Ki; et al, SCIENTIFIC REPORTS, v.6, 2016-01 |
Controlling the infrared optical properties of rf-sputtered NiO films for applications of infrared window Shim, Hyun Bin; Kang, In-Ku; Jeon, Gwang-Jae; Kim, Woo Young; Lee, Hee Chul, INFRARED PHYSICS & TECHNOLOGY, v.72, pp.135 - 139, 2015-09 |
Current Input Extended Counting ADC With Wide Dynamic Range for LWIR FPAs Woo, Doo Hyunf; Kim, Chul Bum; Lee, Hee Chul, IEEE SENSORS JOURNAL, v.9, pp.441 - 448, 2009-04 |
Current-mode background suppression for 2-D LWIR applications Woo, DH; Kang, SG; Lee, Hee Chul, ELECTRONICS LETTERS, v.41, pp.221 - 222, 2005-03 |
Deoxidization of iridium oxide thin film Cha, SY; Lee, Hee Chul, JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, v.38, no.10A, pp.1128 - 1130, 1999-10 |
Dependence of hydrogen and oxygen incorporation on deposition parameters in photochemical vapor deposited mercury free silicon nitride films Sahu, BS; Srivastava, P; Agnihotri, OP; Lee, Hee Chul; Sekhar, BR; Mahapatra, S, THIN SOLID FILMS, v.446, pp.23 - 28, 2004-01 |
Design and implementation of infrared readout circuit using a new input circuit of current mirroring direct injection (CMDI) Yoon, N.; Kim, B.; Lee, Hee Chul; Kim, C., OPTO-ELECTRONICS REVIEW, v.7, no.4, pp.321 - 326, 1999 |
Design of a Readout Circuit for Improving the SNR of Satellite Infrared Time Delay and Integration Arrays Kim, Chul Bum; Woo, Doo Hyung; Lee, Hee Chul, IEICE TRANSACTIONS ON ELECTRONICS, v.E95C, no.8, pp.1406 - 1414, 2012-08 |
Design of a Smart CMOS Readout Circuit for Panoramic X-Ray Time Delay and Integration Arrays Kim, Chul Bum; Woo, Doo Hyung; Kim, Byung Hyuk; Lee, Hee Chul, IEICE TRANSACTIONS ON ELECTRONICS, v.E94C, no.7, pp.1212 - 1219, 2011-07 |
DETERMINATION OF CONDUCTION-BAND TAIL AND FERMI ENERGY OF HEAVILY SI-DOPED GAAS BY ROOM-TEMPERATURE PHOTOLUMINESCENCE LEE, NY; LEE, KJ; LEE, C; KIM, JE; PARK, HY; KWAK, DH; Lee, Hee Chul; et al, JOURNAL OF APPLIED PHYSICS, v.78, no.5, pp.3367 - 3370, 1995-09 |
DISTRIBUTION OF INTERFACIAL AS ATOMS IN THE ELECTRON-BEAM EXPOSURE AND EPITAXY (EBE-EPITAXY) TECHNIQUE FOR GROWING GAAS FILMS ON CAF2/SI(111) STRUCTURES Lee, Hee Chul; ISHIWARA, H; FURUKAWA, S; SAIKI, K; KOMA, A, APPLIED SURFACE SCIENCE, v.41-2, pp.553 - 558, 1989-11 |
Dummy Gate-Assisted n-MOSFET Layout for a Radiation-Tolerant Integrated Circuit Lee, Min Su; Lee, Hee Chul, IEEE TRANSACTIONS ON NUCLEAR SCIENCE, v.60, no.4, pp.3084 - 3091, 2013-08 |
Effect of rapid thermal annealing on the interface trap density between Pt and (Ba,Sr)TiO3 thin film Kwak, DH; Jang, BT; Cha, SY; Lee, JS; Lee, Hee Chul, INTEGRATED FERROELECTRICS, v.17, no.1-4, pp.179 - 186, 1997 |
Effect of sputtering pressure on microstructure and bolometric properties of Nb: TiO2-x films for infrared image sensor applications Reddy, Y. Ashok Kumar; Shin, Young Bong; Kang, In-Ku; Lee, Hee Chul, JOURNAL OF APPLIED PHYSICS, v.119, no.4, 2016-01 |
Effect of substrate temperature on polycrystalline Cd0.9Zn0.1Te thin films studied by Raman scattering spectroscopy Sridharan, M; Mekaladevi, M; Narayandass, SK; Mangalaraj, D; Lee, Hee Chul, CRYSTAL RESEARCH AND TECHNOLOGY, v.39, pp.328 - 332, 2004-04 |
Effects of hydrazine surface treatment on HgCdTe long-wavelength infrared photodiodes Lee, MY; Lee, YS; Lee, Hee Chul, JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS EXPRESS LETTERS, v.44, no.37-41, pp.1252 - 1255, 2005 |
Effects of Ir electrodes on the dielectric constants of Ba0.5Sr0.5TiO3 films Cha, SY; Jang, BT; Lee, Hee Chul, JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, v.38, no.1AB, pp.49 - 51, 1999-01 |
ELECTRON-BEAM EXPOSURE (EBE) AND EPITAXY OF GAAS FILMS ON CAF2/SI STRUCTURES Lee, Hee Chul; ASANO, T; ISHIWARA, H; FURUKAWA, S, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS, v.27, no.9, pp.1616 - 1625, 1988-09 |
Enhanced bolometric properties of nickel oxide thin films for infrared image sensor applications by substitutional incorporation of Li Kang, In-Ku; Reddy, Y. Ashok Kumar; Shin, Young Bong; Kim, Woo Young; Lee, Hee Chul, CERAMICS INTERNATIONAL, v.44, no.7, pp.7808 - 7813, 2018-05 |
Enhanced bolometric properties of TiO2-x thin films by thermal annealing Reddy, Y. Ashok Kumar; Shin, Young Bong; Kang, In-Ku; Lee, Hee Chul; Reddy, P. Sreedhara, APPLIED PHYSICS LETTERS, v.107, no.2, 2015-07 |
Enhancement of the saturation mobility in a ferroelectric-gated field-effect transistor by the surface planarization of ferroelectric film Kim, Woo Young; Jeon, Gwang-Jae; Kang, In-Ku; Shim, Hyun Bin; Lee, Hee Chul, THIN SOLID FILMS, v.591, pp.1 - 7, 2015-09 |
Enhancement of the steady state minority carrier lifetime in HgCdTe photodiode using ECR plasma hydrogenation Jung, H; Lee, Hee Chul; Kim, Choong Ki, JOURNAL OF ELECTRONIC MATERIALS, v.25, no.8, pp.1266 - 1269, 1996-08 |
Etching behavior and damage recovery of SrBi2Ta2O9 thin films Lee, WJ; Cho, CR; Kim, SH; You, IK; Kim, BW; Yu, BG; Shin, CH; et al, JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, v.38, no.12A, pp.1428 - 1431, 1999-12 |
Fabrication and characterization of MFISFET using Al2O3 insulating layer for non-volatile memory Shin, CH; Cha, SY; Lee, Hee Chul; Lee, WJ; Yu, BG; Kwak, DH, INTEGRATED FERROELECTRICS, v.34, no.1-4, pp.1553 - 1560, 2001 |
FORMATION OF GAAS-ON-INSULATOR STRUCTURES ON SI SUBSTRATES BY HETEROEPITAXIAL GROWTH OF CAF2 AND GAAS ASANO, T; ISHIWARA, H; Lee, Hee Chul; TSUTSUI, K; FURUKAWA, S, JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, v.25, no.2, pp.139 - 141, 1986-02 |
HgCdTe-MISFET fabrication with multi-step surface passivation and quantum effects Lee, CH; Paik, SW; Park, JW; Lee, J; Moon, YM; Choi, JB; Jung, H; et al, JOURNAL OF ELECTRONIC MATERIALS, v.27, no.6, pp.668 - 671, 1998-06 |
High injection efficiency readout circuit for low resistance infra-red detector Yoon, N; Kim, B; Lee, Hee Chul; Kim, CK, ELECTRONICS LETTERS, v.35, no.18, pp.1507 - 1508, 1999-09 |
High-Dynamic-Range ROIC With Asynchronous Self-Controlled Two-Gain Modes for MWIR Focal Plane Arrays Kim, Chiyeon; Woo, Doo Hyung; Lee, Hee Chul, IEEE SENSORS JOURNAL, v.19, no.2, pp.615 - 622, 2019-01 |
Hydrogenation of ZnS passivation on narrow-band gap HgCdTe White, JK; Musca, CA; Lee, Hee Chul; Faraone, L, APPLIED PHYSICS LETTERS, v.76, no.17, pp.2448 - 2450, 2000-04 |
Hysteresis analysis in capacitance-voltage characteristics of Pt/(Ba,Sr)TiO3/Pt structures Kwak, DH; Jang, BT; Cha, SY; Lee, SH; Lee, Hee Chul; Yu, BG, INTEGRATED FERROELECTRICS, v.13, no.1-3, pp.413 - 419, 1996 |
Improvement of dielectric properties by inserting oxygen-rich initial layer in Pt/(Ba,Sr)TiO3/Pt structure Kwak, DH; Lee, SH; Jang, BT; Cha, SY; Lee, Hee Chul, INTEGRATED FERROELECTRICS, v.20, no.1-4, pp.205 - 214, 1998 |
Improvement of the thermal stability of Nb:TiO2-x samples for uncooled infrared detectors Reddy, Y. Ashok Kumar; Kang, In-Ku; Shin, Young Bong; Lee, Hee Chul, JOURNAL OF PHYSICS D-APPLIED PHYSICS, v.51, no.2, 2018-01 |
In-pixel edge detection circuit without non-uniformity correction for an infrared focal plane array (IRFPA) Kiw, CB; Woo, DH; Lee, Yong Soo; Lee, Hee Chul, IEICE TRANSACTIONS ON ELECTRONICS, v.E91C, pp.235 - 239, 2008-02 |
Influence of Nb Doping Concentration on Bolometric Properties of RF Magnetron Sputtered Nb:TiO2-x Films Reddy, Y. Ashok Kumar; Shin, Young Bong; Kang, In-Ku; Lee, Hee Chul, JOURNAL OF ELECTRONIC MATERIALS, v.47, no.3, pp.2171 - 2176, 2018-03 |
Influence of passivation layer on thermal stability of Nb:TiO2-x samples for shutter-less infrared image sensors Reddy, Y. Ashok Kumar; Ajitha, B.; Shin, Young Bong; Kang, In-Ku; Lee, Hee Chul, INFRARED PHYSICS & TECHNOLOGY, v.100, pp.52 - 56, 2019-08 |
Influence of thermal annealing on the structural and optical properties of polycrystalline Cd0.96Zn0.04Te thin films Sridharan, MG; Narayandass, SK; Mangalaraj, D; Lee, Hee Chul, JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, v.7, pp.1483 - 1491, 2005-06 |
Influence of TiO2 adhesion layer thickness on properties of (Ba,Sr)TiO3 thin films Kim, YJ; Lee, YS; Lee, Hee Chul, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, v.44, pp.6167 - 6169, 2005-08 |
Iridium thin film as a bottom electrode for high dielectric (Ba,Sr)TiO3 capacitors Cha, SY; Jang, BT; Kwak, DH; Shin, CH; Lee, Hee Chul, INTEGRATED FERROELECTRICS, v.17, no.1-4, pp.187 - 195, 1997 |
Layout Modification of a PD-SOI n-MOSFET for Total Ionizing Dose Effect Hardening Roh, Young Tak; Lee, Hee Chul, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.66, no.1, pp.308 - 315, 2019-01 |
Local Electro-Thermal Annealing for Repair of Total Ionizing Dose-Induced Damage in Gate-All-Around MOSFETs Park, Jun-Young; Moon, Dong-Il; Bae, Hagyoul; Roh, Young Tak; Seol, Myeong-Lok; Lee, Byung-Hyun; Jeon, Chang-Hoon; et al, IEEE ELECTRON DEVICE LETTERS, v.37, no.7, pp.843 - 846, 2016-07 |
Low Power Pixel-Level ADC Readout Circuit for an Amorphous Silicon-Based Microbolometer Ha, Dong-Heon; Hwang, Chi Ho; Lee, Yong Soo; Lee, Hee Chul, IEICE TRANSACTIONS ON ELECTRONICS, v.E92C, pp.708 - 712, 2009-05 |
Low-Noise and Wide-Dynamic-Range ROIC With a Self-Selected Capacitor for SWIR Focal Plane Arrays Kim, Yeong Seon; Woo, Doo Hyung; Jo, Young Min; Kang, Sang Gu; Lee, Hee Chul, IEEE SENSORS JOURNAL, v.17, no.1, pp.179 - 184, 2017-01 |
Measurement of the steady-state minority carrier diffusion length in a HgCdTe photodiode Jung, H; Lee, Hee Chul; Kim, CK, JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, v.35, no.10B, pp.1321 - 1323, 1996-10 |
Microstructural Effects on Nickel Oxide Film Properties in an Infrared Electrochromic Window for Shutter-Less Infrared Sensor Application Shim, Hyun Bin; Kim, Woo Young; Kang, In-Ku; Lee, Hee Chul, IEEE SENSORS JOURNAL, v.17, no.20, pp.6522 - 6528, 2017-10 |
Mismatch-tolerant read-in IC with voltage-drop compensation for infrared scene projectors Shin, Uisub; Cho, Min Ji; Lee, Hee Chul, IEICE ELECTRONICS EXPRESS, v.15, no.11, 2018-06 |
MSM Photodetector on a Polysilicon Membrane for a Silicon-Based Wafer-Level Packaged LED Kim, Jin Kwan; Lee, Hee Chul, IEEE PHOTONICS TECHNOLOGY LETTERS, v.25, no.24, pp.2462 - 2465, 2013-12 |
Multiple integration method for a high signal-to-noise ratio readout integrated circuit Kang, SG; Woo, DH; Lee, Hee Chul, IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS, v.52, pp.553 - 557, 2005-09 |
Nanoporous Pirani sensor based on anodic aluminum oxide Jeon, Gwang-Jae; Kim, Woo-Young; Shim, Hyun Bin; Lee, Hee Chul, APPLIED PHYSICS LETTERS, v.109, no.12, 2016-09 |
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