Browse "School of Electrical Engineering(전기및전자공학부)" by Author Park, Jun-Young
Showing results 40 to 61 of 61
| Nano-electromechanical Switch Based on a Physical Unclonable Function for Highly Robust and Stable Performance in Harsh Environments Hwang, Kyu-Man; Park, Jun-Young; Bae, Hagyoul; Lee, Seung-Wook; Kim, Choong-Ki; Seo, Myungsoo; Im, Hwon; et al, ACS NANO, v.11, no.12, pp.12547 - 12552, 2017-12 |
| Nanoscale FET-Based Transduction toward Sensitive Extended-Gate Biosensors Kwon, Jae; Lee, Byung-Hyun; Kim, Seong-Yeon; Park, Jun-Young; Bae, Hagyoul; Choi, Yang-Kyu; Ahn, Jae-Hyuk, ACS SENSORS, v.4, no.6, pp.1724 - 1729, 2019-06 |
On-Chip Curing by Microwave for Long Term Usage of Electronic Devices in Harsh Environments Park, Jun-Young; Kim, Weon-Guk; Bae, Hagyoul; Jin, Ik Kyeong; Kim, Da-Jin; Im, Hwon; Tcho, Il-Woong; et al, SCIENTIFIC REPORTS, v.8, 2018-10 |
| On-chip learning multi-class support vector machine processor = 학습 기능을 내장한 다중 분류 Support Vector Machine 프로세서link Park, Jun-Young; 박준영; et al, 한국과학기술원, 2011 |
| Physically Transient Memory on a Rapidly Dissoluble Paper for Security Application Bae, Hagyoul; Lee, Byung-Hyun; Lee, Dongil; Seol, Myeong-Lok; Kim, Daewon; Han, Jin-Woo; Kim, Choong-Ki; et al, SCIENTIFIC REPORTS, v.6, 2016-12 |
| Power Reduction for Recovery of a FinFET by Electrothermal Annealing Han, Joon-Kyu; Park, Jun-Young; Choi, Yang-Kyu, SOLID-STATE ELECTRONICS, v.151, pp.6 - 10, 2019-01 |
| Power Reduction in Punch-Through Current-Based Electro-Thermal Annealing in Gate-All-Around FETs Kim, Min-Kyeong; Choi, Yang-Kyu; Park, Jun-Young, MICROMACHINES, v.13, no.1, 2022-01 |
| Sanitization of Data in Nanoscale Flash Memory by Thermal Erasing and Reuse of Storage Park, Jun-Young; Moon, Dong-Il; Kim, Seong-Yeon; Im, Hwon; Chang, Ki Soo; Jeong, Chanbae; Choi, Yang-Kyu, PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, v.215, no.14, 2018-07 |
| Self-Curable Gate-All-Around MOSFETs Using Electrical Annealing to Repair Degradation Induced From Hot-Carrier Injection Park, Jun-Young; Moon, Dong-Il; Seol, Myeong-Lok; Kim, Choong-Ki; Jeon, Chang-Hoon; Bae, Hagyoul; Bang, Tewook; et al, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.63, no.3, pp.910 - 915, 2016-03 |
| Self-Heating Effects in 3-D Vertical-NAND (V-NAND) Flash Memory Yun, Gyeong-Jun; Yun, Dae-Hwan; Park, Jun-Young; Kim, Seong-Yoen; Choi, Yang-Kyu, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.67, no.12, pp.5505 - 5510, 2020-12 |
| Self-powered data erasing of nanoscale flash memory by triboelectricity Jin, Ik Kyeong; Park, Jun-Young; Lee, Byung-Hyun; Jeon, Seung-Bae; Tcho, Il-Woong; Park, Sang-Jae; Kim, Weon-Guk; et al, NANO ENERGY, v.52, pp.63 - 70, 2018-10 |
| Suppression of Self-Heating Effects in 3-D V-NAND Flash Memory Using a Plugged Pillar-Shaped Heat Sink Park, Jun-Young; Yun, Dae-Hwan; Kim, Seong-Yeon; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.40, no.2, pp.212 - 215, 2019-02 |
| Sustainable Electronics for Nano-Spacecraft in Deep Space Missions Moon, Dong-Il; Park, Jun-Young; Han, Jin-Woo; Jeon, Gwang-Jae; Kim, Jee-Yeon; Moon, Jin-Bum; Seol, Myeong-Lok; et al, International Electron Devices Meeting (IEDM), IEEE, 2016-12-07 |
| Thermal hardware-based data security device that permanently erases data by using local heat generation phenomenon and method thereof Choi, Yang-Kyu; Park, Jun-Young |
| Three-Dimensional Fin-Structured Semiconducting Carbon Nanotube Network Transistor Lee, Dong-Il; Lee, Byung-Hyun; Yoon, Jinsu; Ahn, Dae-Chul; Park, Jun-Young; Hur, Jae; Kim, Myung-Su; et al, ACS NANO, v.10, no.12, pp.10894 - 10900, 2016-12 |
| Threshold Voltage Tuning Technique in Gate-All-Around MOSFETs by Utilizing Gate Electrode With Potential Distribution Park, Jun-Young; Bae, Hagyoul; Moon, Dong-Il; Jeon, Chang-Hoon; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.37, no.11, pp.1391 - 1394, 2016-11 |
| Triboelectric nanogenerator for a repairable transistor with self-powered electro-thermal annealing Kim, Weon-Guk; Han, Joon-Kyu; Tcho, Il-Woong; Park, Jun-Young; Yu, Ji-Man; Choi, Yang-Kyu, NANO ENERGY, v.76, pp.105000, 2020-10 |
| Tunneling field-effect transistor with a plurality of nano-wires and fabrication method thereof Choi, Yang-Kyu; Park, Jun-Young, 2018-06-12 |
| Ultra-Fast Erase Method of SONOS Flash Memory by Instantaneous Thermal Excitation Ahn, Dae-Chul; Seol, Myeong-Lok; Hur, Jae; Moon, Dong-Il; Lee, Byung-Hyun; Han, Jin-Woo; Park, Jun-Young; et al, IEEE ELECTRON DEVICE LETTERS, v.37, no.2, pp.190 - 192, 2016-02 |
| Vertically Integrated zRAM (VI-zRAM): Toward Extremely Scaled Memory Lee, Byung-Hyun; Ahn, Dae-Chul; Kang, Min-Ho; Jeon, Seung-Bae; Bang, Te-Wook; Bae, Hagyoul; Park, Jun-Young; et al, ECS PRIME, ECS PRIME, 2016-10-05 |
| Vertically-integrated 3-dimensional flash memory for high reliable flash memory and fabrication method thereof Choi, Yang-Kyu; Park, Jun-Young |
| 트랜지스터 손상 치료 방법 및 이를 이용한 디스플레이 장치 최양규; Kim, Choong-Ki; Bae, Hagyoul; Park, Jun-Young, 2018-10-01 |
Discover
Open Access
- 573 OA Article
Date issued
- 4,871 2020 - 2024
- 18,943 2010 - 2019
- 15,019 2000 - 2009
- 7,644 1990 - 1999
- 2,391 1980 - 1989