Browse "School of Electrical Engineering(전기및전자공학부)" by Title 

Showing results 22601 to 22620 of 51089

22601
Investigation of Plane-to-Plane Noise Coupling through Cutout in Multi-layer Power/Ground Planes

Kim, Joungho; Lee, Junwoo; Seng, Yeo Mui; Iyer, Mahadevan K, IEEE 4th Electronics Packaging Technology Conference, pp.257 - 260, IEEE, 2002-12

22602
Investigation of polymer-free graphene transfer and passivation layer for enhanced reliability of graphene field-effect transistors = 그래핀 소자의 신뢰성 향상을 위한 전사 과정과 부동화 피막에 관한 연구link

Park, Hamin; 박하민; et al, 한국과학기술원, 2015

22603
Investigation of process dependence of graphene growth on nickel thin film

Cho, Byung Jin; Mun, JH; Hwang, C; Lim, SK, 56th AVS symposium, 2009-11-09

22604
Investigation of pump wavelength dependence of long-wavelength-band erbium-doped fiber amplifier using 1530nm-band pump for WDM amplification

Choi, B.H.; Park, HyoHoon; Chu, M., Optical Fiber Conference, v.54, pp.0 - 0, 2001-03-17

22605
Investigation of PVD HfO2 MIM capacitors for Si RF and Mixed signal ICs application

Cho, Byung Jin; Hang, H; Ding, SJ; Zhu, C; Rustagi, RC; Lu, YF; Li, MF, International semiconductor device research symposium, pp.0 - 0, 2003-12-10

22606
Investigation of quasi-breakdown mechanism in ultrathin gate oxides

Cho, Byung Jin; He, YD; Guan, H; Li, MF; Dong, Z, Materials Research Society (MRS) 1999 Fall Meeting Symp. Proc., pp.0 - 0, 1999-11-29

22607
Investigation of quasi-breakdown mechanism through post-quasi-breakdown thermal annealing

Loh, WY; Cho, Byung Jin; Li, MF, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS, v.41, no.5A, pp.2873 - 2877, 2002-05

22608
Investigation of reliability degradation of ultra-thin gate oxides irradiated under electron-beam lithography conditions

Chong, PF; Cho, Byung Jin; Chor, EF; Joo, MS; Yeo, IS, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS, v.39, no.4B, pp.2181 - 2185, 2000-04

22609
Investigation of Self-Heating Effects in Gate-All-Around MOSFETs With Vertically Stacked Multiple Silicon Nanowire Channels

Park, Jun-Young; Lee, Byung-Hyun; Chang, Ki Soo; Kim, Dong Uk; Jeong, Chanbae; Kim, Choong-Ki; Bae, Hagyoul; et al, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.64, no.11, pp.4393 - 4399, 2017-11

22610
Investigation of sensing mechanism in nanogap embedded FET biosensor and its application = 나노갭을 갖는 전계 효과 트랜지스터 바이오센서의 동작 원리 규명 및 그 응용link

Kim, Chang-Hoon; 김창훈; et al, 한국과학기술원, 2013

22611
Investigation of Silicon Nanowire Gate-All-Around Junctionless Transistors Built on a Bulk Substrate

Moon, Dong-Il; Choi, Sung-Jin; Duarte, Juan Pablo; Choi, Yang-Kyu, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.60, no.4, pp.1355 - 1360, 2013-04

22612
Investigation of Size Dependence on Sensitivity for Nanowire FET Biosensors

Ahn, Jae-Hyuk; Choi, Sung-Jin; Han, Jin-Woo; Park, Tae-Jung; Lee, Sang-Yup; Choi, Yang-Kyu, IEEE TRANSACTIONS ON NANOTECHNOLOGY, v.10, no.6, pp.1405 - 1411, 2011-11

22613
Investigation of the gate oxide integrity of the nitrided gate oxide using nitrogen implantation into polysilicon gate

Cho, Byung Jin; Ko, LH; Nga, YA; Chan, LH, Abstract Proc. of the Asia-Pacific SIA'98 Conf., pp.0 - 0, 1998-11-30

22614
Investigation of the mechanism of floating node assisted CMOS latch-up

Sim, S.-P.; Guo, P.; Kordesch, A.; Chen, W.F.; Liu, C.-M.; Yang, C.Y.; Lee, Kwyro, 2001 International Conference on Modeling and Simulation of Microsystems - MSM 2001, pp.526 - 529, 2001-03-19

22615
Investigation of the Nanoparticle Electrical Contact Lubrication in MEMS Switches

Ko, Seung-Deok; Seo, Min-Ho; Yoon, Yong Hoon; Han, Chang-Hoon; Lim, Keun Seo; Kim, Chang-Keun; Yoon, Jun-Bo, JOURNAL OF MICROELECTROMECHANICAL SYSTEMS, v.26, no.6, pp.1417 - 1427, 2017-12

22616
Investigation of the source-side injection characteristic of a dopant-segregated Schottky barrier metal-oxide-semiconductor field-effect-transistor

Kim, Sung-Ho; Choi, Sung-Jin; Jang, Moon-Gyu; Choi, Yang-Kyu, APPLIED PHYSICS LETTERS, v.95, no.6, 2009-08

22617
Investigation of Thermoelectric Material-Electrode Contacts by Specific Contact Resistance with Various Current Sources

Kim, Yeongseon; Park, Sang Hyun; Jin, Younghwan; Lee, Eunju; Yoon, Giwan, 2015 International Conference on Thermoelectrics (ICT2015), International Thermoelectric Society, 2015-07-01

22618
Investigation of voltage reduction in nanostructure-embedded organic light-emitting diodes

Kim, Jin-Yeong; Kim, Woo Hyun; Kim, Do-Hong; Choi, Kyung Cheol, ORGANIC ELECTRONICS, v.15, no.1, pp.260 - 265, 2014-01

22619
Investigation of wall and space charges decay using pulse technique in AC plasma display panel

Choi, Kyung Cheol; Kim, BJ; Shin, BJ, IEEE TRANSACTIONS ON PLASMA SCIENCE, v.34, pp.403 - 408, 2006-04

22620
Investigation on high performance 1 transistor capacitorless DRAM with PiFET and ONO structure for embedded memory = Embedded memory를 위한 PiFET과 ONO 구조를 갖는 고성능 1 transistor capacitorless DRAM 연구link

Bae, Dong-iL; 배동일; et al, 한국과학기술원, 2008

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