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College of Engineering(공과대학)School of Electrical Engineering(전기및전자공학부)EE-Conference Papers(학술회의논문)

Investigation of quasi-breakdown mechanism in ultrathin gate oxidesInvestigation of quasi-breakdown mechanism in ultrathin gate oxides

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Cho, Byung Jinresearcher / He, YD / Guan, H / Li, MF / Dong, Z
Issue Date
1999-11-29
Language
ENG
Citation

Materials Research Society (MRS) 1999 Fall Meeting Symp. Proc., pp.0 - 0

URI
http://hdl.handle.net/10203/130411
Appears in Collection
EE-Conference Papers(학술회의논문)
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