Latch-up based bidirectional npn selector for bipolar resistance-change memory

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A vertically integrated latch-up based n-p-n bidirectional diode, which is analogous to an open-base bipolar junction transistor, is demonstrated for bipolar resistance-change memory selector application. A maximum current density of >50 MA/cm(2) and a selectivity of >10(4) are observed at a fast switching speed of within 10 ns. The high selectivity as a consequence of the sudden latch-up process is feasible owing to the positive-feedback process initiated by impact ionization. The optimization of the turn-on voltage is comprehensively investigated by numerical device simulation, which ensures the promising potential of the latch-up based selector device. (C) 2013 AIP Publishing LLC.
Publisher
AMER INST PHYSICS
Issue Date
2013-07
Language
English
Article Type
Article
Keywords

RRAM

Citation

APPLIED PHYSICS LETTERS, v.103, no.3

ISSN
0003-6951
DOI
10.1063/1.4813832
URI
http://hdl.handle.net/10203/193072
Appears in Collection
EE-Journal Papers(저널논문)
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