Latch-up based bidirectional npn selector for bipolar resistance-change memory

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dc.contributor.authorKim, Sung-Hoko
dc.contributor.authorMoon, Dong-Ilko
dc.contributor.authorLu, Weiko
dc.contributor.authorKim, Dae-Hwanko
dc.contributor.authorKim, Dong-Myongko
dc.contributor.authorChoi, Yang-Kyuko
dc.contributor.authorChoi, Sung-Jinko
dc.date.accessioned2015-01-27T02:12:43Z-
dc.date.available2015-01-27T02:12:43Z-
dc.date.created2013-09-05-
dc.date.created2013-09-05-
dc.date.issued2013-07-
dc.identifier.citationAPPLIED PHYSICS LETTERS, v.103, no.3-
dc.identifier.issn0003-6951-
dc.identifier.urihttp://hdl.handle.net/10203/193072-
dc.description.abstractA vertically integrated latch-up based n-p-n bidirectional diode, which is analogous to an open-base bipolar junction transistor, is demonstrated for bipolar resistance-change memory selector application. A maximum current density of >50 MA/cm(2) and a selectivity of >10(4) are observed at a fast switching speed of within 10 ns. The high selectivity as a consequence of the sudden latch-up process is feasible owing to the positive-feedback process initiated by impact ionization. The optimization of the turn-on voltage is comprehensively investigated by numerical device simulation, which ensures the promising potential of the latch-up based selector device. (C) 2013 AIP Publishing LLC.-
dc.languageEnglish-
dc.publisherAMER INST PHYSICS-
dc.subjectRRAM-
dc.titleLatch-up based bidirectional npn selector for bipolar resistance-change memory-
dc.typeArticle-
dc.identifier.wosid000322146300107-
dc.identifier.scopusid2-s2.0-84881506670-
dc.type.rimsART-
dc.citation.volume103-
dc.citation.issue3-
dc.citation.publicationnameAPPLIED PHYSICS LETTERS-
dc.identifier.doi10.1063/1.4813832-
dc.contributor.localauthorChoi, Yang-Kyu-
dc.contributor.nonIdAuthorMoon, Dong-Il-
dc.contributor.nonIdAuthorLu, Wei-
dc.contributor.nonIdAuthorKim, Dae-Hwan-
dc.contributor.nonIdAuthorKim, Dong-Myong-
dc.type.journalArticleArticle-
dc.subject.keywordPlusRRAM-
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