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A value-added predictive defect type distribution model based on project characteristics

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Hong, Youngki / Baik, Jongmoonresearcher / Ko, In-Youngresearcher / Choi, Ho-Jinresearcher
Publisher
ICIS
Issue Date
2008-05-14
Language
ENG
Citation

7th IEEE/ACIS International Conference on Computer and Information Science, IEEE/ACIS ICIS 2008, pp.469 - 474

URI
http://hdl.handle.net/10203/18783
Appears in Collection
CS-Conference Papers(학술회의논문)
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