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A value-added predictive defect type distribution model based on project characteristics

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dc.contributor.authorHong, Youngki-
dc.contributor.authorBaik, Jongmoon-
dc.contributor.authorKo, In-Young-
dc.contributor.authorChoi, Ho-Jin-
dc.date.accessioned2010-06-09T02:25:37Z-
dc.date.available2010-06-09T02:25:37Z-
dc.date.created2012-02-06-
dc.date.issued2008-05-14-
dc.identifier.citation7th IEEE/ACIS International Conference on Computer and Information Science, IEEE/ACIS ICIS 2008, v., no., pp.469 - 474-
dc.identifier.urihttp://hdl.handle.net/10203/18783-
dc.languageENG-
dc.language.isoen_USen
dc.publisherICIS-
dc.titleA value-added predictive defect type distribution model based on project characteristics-
dc.typeConference-
dc.identifier.scopusid2-s2.0-51349156298-
dc.type.rimsCONF-
dc.citation.beginningpage469-
dc.citation.endingpage474-
dc.citation.publicationname7th IEEE/ACIS International Conference on Computer and Information Science, IEEE/ACIS ICIS 2008-
dc.identifier.conferencecountryUnited States-
dc.contributor.localauthorBaik, Jongmoon-
dc.contributor.localauthorKo, In-Young-
dc.contributor.localauthorChoi, Ho-Jin-
dc.contributor.nonIdAuthorHong, Youngki-
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