Browse "School of Electrical Engineering(전기및전자공학부)" by Title 

Showing results 12741 to 12760 of 51620

12741
CST-FORMER: TRANSFORMER WITH CHANNEL-SPECTRO-TEMPORAL ATTENTION FOR SOUND EVENT LOCALIZATION AND DETECTION

SHUL, YUSUN; Choi, Jung-Woo, IEEE International Conference on Acoustics, Speech and Signal Processing, IEEE Signal Processing Society, 2024-04-17

12742
CTEM 및 CCTEM cell의 TEM 파 해석 = TEM wave analysis of CTEM and CCTEM cellslink

김현수; Kim, Hyunsoo; et al, 한국과학기술원, 2015

12743
CTL 셀의 모드 매칭법

엄효준; 김도훈, 2012년도 전파 및 광파기술 학술대회, v.13, no.1, pp.51 - 52, 한국전자파학회, 2012-11-09

12744
Cu Foil Pre-treatment for High-quality Graphene Synthesis and Low-Defect Transfer in Large Scale

Jung, Dae Yool; Yang, Sang Yoon; Hong, Woonggi; Choi, Sung-Yool, AsiaNANO 2016, AsiaNANO 2016, 2016-10-12

12745
Cu-based multilayer transparent electrodes: A low-cost alternative to ITO electrodes in organic solar cells

Lim, Sooyeon; Han, Donggeon; Kim, Hoyeon; Lee, Soohyun; Yoo, Seunghyup, SOLAR ENERGY MATERIALS AND SOLAR CELLS, v.101, pp.170 - 175, 2012-06

12746
Cu-Bi-Te계 열전 재료 및 그 형성 방법

조병진; 정인; 차준일

12747
CUA Loss: Class Uncertainty-Aware Gradient Modulation for Robust Object Detection

Kim, Jung Uk; Kim, Seong Tae; Lee, Hong Joo; Lee, Sangmin; Ro, Yong Man, IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS FOR VIDEO TECHNOLOGY, v.31, no.9, pp.3529 - 3543, 2021-09

12748
Cube-based Intra-Datacenter Networks with LOBS-HC

Peng, Li-Mai; Chunming, Qiao; Wan, Tang; Youn, Chan-Hyun, IEEE International Conference on Communication (ICC), 2012, IEEE, 2012-06

12749
Cubic structured HfLaO dielectrics for MIM capacitor for RF IC applications

Zhang, L.; He, W.; Chan, D.S.H.; Cho, Byung Jin, International Symposium on Silicon Nitride, Silicon Dioxide, and Emerging Dielectrics - 215th Meeting of the Electrochemical Society, v.19, pp.615 - 623, 2009-05-24

12750
Cubic-Structured HfLaO for the Blocking Layer of a Charge-Trap Type Flash Memory Device

Park, Jong-Kyung; Park, Young-Min; Song, Myeong-Ho; Lim, Sung-Kyu; Oh, Jae-Sub; Joo, Moon-Sig; Hong, Kwon; et al, APPLIED PHYSICS EXPRESS, v.3, no.9, 2010-08

12751
Cubic-Structured HfO2 With Optimized Doping of Lanthanum for Higher Dielectric Constant

He, Wei; Zhang, Lu; Chan, Daniel S. H.; Cho, BJ; Zhang, L; Cho, Byung Jin, IEEE ELECTRON DEVICE LETTERS, v.30, no.6, pp.623 - 625, 2009-06

12752
CUDA$^2$: 경쟁 학습을 통한 연속적 비지도 도메인 적응 = CUDA$^2$: continual unsupervised domain adaptation with adversarial Learninglink

김준혁; 김종환; et al, 한국과학기술원, 2021

12753
Cultural influences on neural basis of intergroup empathy

Cheon, Bobby K.; Im, Dong-mi; Harada, Tokiko; Kim, Ji-Sook; Mathur, Vani A.; Scimeca, Jason M.; Parrish, Todd B.; et al, NEUROIMAGE, v.57, no.2, pp.642 - 650, 2011-07

12754
Cultural modulation of the neural correlates of emotional pain perception: The role of other-focusedness

Cheon, Bobby K.; Im, Dong-Mi; Harada, Tokiko; Kim, Ji-Sook; Mathur, Vani A.; Scimeca, Jason M.; Parrish, Todd B.; et al, NEUROPSYCHOLOGIA, v.51, no.7, pp.1177 - 1186, 2013-06

12755
Cumulant Matrix-based Channel Estimation for Near-Field Massive MIMO Systems

Seo, Kyoungchan; Gil, Gye-Tae; Kwon, Girim; Hong, Songcheol; Park, Hyuncheol, 12th International Conference on ICT Convergence (ICTC) - Beyond the Pandemic Era with ICT Convergence Innovation, pp.1603 - 1608, IEEE, 2021-10-22

12756
Curing of 1-Transistor-DRAM by Joule Heat From Punch-Through Current

Kim, Hyun-Jung; Lee, Geon-Beom; Han, Joon-Kyu; Han, Seong-Joo; Kim, Da-Jin; Yu, Ji-Man; Kim, Myung-Su; et al, IEEE ELECTRON DEVICE LETTERS, v.43, no.3, pp.370 - 373, 2022-03

12757
Curing of Aged Gate Dielectric by the Self-Heating Effect in MOSFETs

Park, Jun-Young; Moon, Dong-Il; Lee, Geon-Beom; Choi, Yang-Kyu, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.67, no.3, pp.777 - 788, 2020-03

12758
Curing of Hot-Carrier Induced Damage by Gate-Induced Drain Leakage Current in Gate-All-Around FETs

Park, Jun-Young; Yun, Dae-Hwan; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.40, no.12, pp.1909 - 1912, 2019-12

12759
Curing of oxide damage in a MOSFET with joule heat by forward junction current = 소스 및 드레인 정방향 접합 전류에 의해 발생한 줄 열을 이용하여 모스펫의 손상을 복구시키는 방법link

Lee, Geon-Beom; Choi, Yang-Kyu; et al, 한국과학기술원, 2018

12760
Current boosted active clamp forward converter without output filter

Lee, Keun Woo; Choi, Seong-Wook; Lee, Byoung-Hee; Moon, GunWoo, Energy Conversion Congress and Exposition, 2009. ECCE 2009. IEEE, pp.2873 - 2880, IEE, 2009-09-20

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