학위논문(석사) - 한국과학기술원 : 전기및전자공학부, 2018.2,[ii, 32 p. :]
Charge pumping(CP)▼agate dielectric curing▼ahot-carrier injection(HCI)▼aJoule heat▼alateral profiling▼alow-frequency noise(LFN) characterization▼aPN-junction▼arecovery
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