Showing results 5 to 8 of 8
Improvement of morphological stability of PEALD-iridium thin films by adopting two-step annealing process Kim, Sung-Wook; Kwon, Se-Hun; Jeong, Seong-Jun; Park, Jin-Seong; Kang, Sang-Won, ELECTROCHEMICAL AND SOLID STATE LETTERS, v.11, no.11, pp.H303 - H305, 2008-09 |
Low frequency and microwave performances of Ba0.6Sr0.4TiO3 films on atomic layer deposited TiO2/high resistivity Si substrates Kim, HS; Kim, Il-Doo; Kim, KB; Yun, TS; Lee, JC; Tuller, HL; Choi, WY; et al, JOURNAL OF ELECTROCERAMICS, v.17, pp.421 - 425, 2006-12 |
Low-voltage organic transistors and depletion-load inverters with high-K pyrochlore BZN gate dielectric on polymer substrate Choi, Y; Kim, Il-Doo; Tuller, HL; Akinwande, AI, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.52, pp.2819 - 2824, 2005-12 |
Structural and dielectric properties of epitaxial Ba0.6Sr0.4TiO3 thin films grown on Si substrates with thin SrO buffer layers Kim, HS; Hyun, TS; Kim, Ho Gi; Yun, TS; Lee, JC; Kim, Il-Doo, JOURNAL OF ELECTROCERAMICS, v.18, pp.305 - 309, 2007-08 |
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