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Showing results 95741 to 95760 of 275872
| Gastrointestinal optical coherence tomography probe with extended depth of focus using spatial filter Xing, Jing Chao; Yoo, Hongki, SMIT-IBEC 2018, SMIT, KOSOMBE, 2018-11-09 |
| GATA3 induces the upregulation of UCP-1 by directly binding to PGC-1 alpha during adipose tissue browning Son, Min Jeong; Oh, Kyoung-Jin; Park, Anna; Kwon, Min-Gi; Suh, Jae Myoung; Kim, Il-Chul; Kim, Seyun; et al, METABOLISM-CLINICAL AND EXPERIMENTAL, v.109, 2020-08 |
| Gate and functional level logic simulation with 8-state signal model = 8-상태의 신호 모델을 이용한 게이트 및 기능 레벨의 논리 시뮬레이션link Kweon, Tai-Wook; 권태욱; et al, 한국과학기술원, 1983 |
| Gate Bias Dependence of Substrate Signal Coupling Effect in RF MOSFETs Je, Minkyu; Shin, Hyung-Cheol, IEEE ELECTRON DEVICE LETTERS, v.24, no.3, pp.183 - 185, 2003-03 |
| Gate bias induced degradation in hydrogenated amorphous silicon thin film transistors = 수소화된 비정질 실리콘 박막 트랜지스터에서 게이트 바이어스에 의해 생성되는 열화현상에 대한 연구link Hwang, Chi-Sun; 황치선; Shin, Sung-Chul; Lee, Choo-Chon; et al, 한국과학기술원, 1996 |
| Gate Control of Spin-Orbit Torque in a Sputtered Bi2Se3/Ni81Fe19 Device Han, Ki Hyuk; Park, Youn Ho; Ahn, Jeong Ung; Kim, Seong Been; Kim, Kyoung-Whan; Park, Tae-Eon; Lee, OukJae; et al, ACS APPLIED ELECTRONIC MATERIALS, v.5, no.5, pp.2725 - 2731, 2023-05 |
| Gate Controlled Diode를 이용한 HgCdTe의 표면재결합속도 측정 이희철; 최종화, 제6회 한국반도체 학술대회, pp.183 - 184, 1999 |
| Gate Controlled Diode를 이용한 HgCeTe Photodiode의 특성평가 Lee, Hee-Chul; Choi, Jong-Hwa, 새물리, v.41, no.4, pp.235 - 238, 2000-10 |
| Gate controlled magnetoresistance in a silicon metal-oxide-semiconductor field-effect-transistor Ciccarelli, C; Park, Byong Guk; Ogawa, S; Ferguson, AJ; Wunderlich, J, APPLIED PHYSICS LETTERS, v.97, no.8, 2010-08 |
| Gate Delay Characteristics of a Sub-30nm MOS Device with Non-Overlapped Source-Drain to Gate Fegion hyunjin lee; sung-il chang; hyungcheol shin; joungho lee, JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.41, no.6, pp.937 - 941, 2002-12 |
| Gate delay characteristics of sub 30 nm MOS with non-overlapped source-drain to gate 신형철, 제9회 반도체학술대회, 한국반도체학술대회, 2002-02 |
| Gate Delay Modeling for Static Timing Analysis of Body-Biased Circuits Baek, Donkyu; Ship, Insup; Shin, Youngsoo, IEEE International Conference on Integrated Circuit Design and Technology (ICICDT), IEEE, 2012-05-31 |
| Gate driving method for synchronous rectifiers in phase-shifted full-bridge converter Baek, Jae-Il; Kim, Chong-Eun; Lee, Jae-Bum; Youn, Han-Shin; Moon, Gun-Woo, Power Electronics and ECCE Asia (ICPE-ECCE Asia), 2015 9th International Conference on, pp.753 - 758, IEEE, 2015-06-02 |
| Gate insulator for high mobility oxide TFT Park, Sang-Hee Ko; Kim, HO; Cho, SH; Ryu, MK; Yang, JH; Ko, Jong Beom; Hwang, CS, 12th Symposium on Thin Film Transistor Technologies, TFT 2014 - 2014 ECS and SMEQ Joint International Meeting, pp.123 - 128, Electrochemical Society Inc., 2014-10 |
| Gate leakage current in double-gate MOSFETs with Si/SiO2 interface model from first principle calculations Park, Y.; Kong, K.-J.; Chang, H.; Shin, Mincheol, 2010 10th IEEE Conference on Nanotechnology, NANO 2010, pp.1109 - 1112, IEEE, 2010-08-17 |
| Gate location design in injection molding of an automobile junction box with integral hinges Kim, HS; Son, JS; Im, Yong-Taek, JOURNAL OF MATERIALS PROCESSING TECHNOLOGY, v.140Special, no.SI, pp.110 - 115, 2003-09 |
| Gate Oxide Damage by Plasma Oxide Deposition and Via RIE Hyung-Cheol Shin, American Vacuum Society Plasma Etch 1992 Symposium, 1992 |
| Gate oxide damage from high dose implantation of hydrogen Choi, Yang-Kyu; Yun, C; Park, D; Cheung, N, the 13th International Conference on Ion Implantation Technology, 2000-09 |
| Gate oxide reliability concern associated with X-ray lithography Cho, Byung Jin; Kim, SJ; Ang, CH; Ling, CH; Joo, MS; Yeo, IS, Extended Abstract of the 200 International Conf. on Solid State Devices and Materials (SSDM), pp.0 - 0, 2000-08-28 |
| GATE TECHNOLOGY FOR 0.1-MU-M SI COMPLEMENTARY METAL-OXIDE-SEMICONDUCTOR USING G-LINE EXPOSURE AND DEEP-ULTRAVIOLET HARDENING Jeon, DukYoung; CHIN, GM; LEE, KF; YAN, RH; WESTERWICK, E; CERULLO, M, JOURNAL OF VACUUM SCIENCE TECHNOLOGY B, v.12, no.4, pp.2800 - 2804, 1994 |
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