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College of Engineering(공과대학)School of Electrical Engineering(전기및전자공학부)EE-Conference Papers(학술회의논문)

Gate Controlled Diode를 이용한 HgCdTe의 표면재결합속도 측정

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이희철researcher / 최종화
Issue Date
1999
Language
KOR
Citation

제6회 한국반도체 학술대회, pp.183 - 184

URI
http://hdl.handle.net/10203/132852
Appears in Collection
EE-Conference Papers(학술회의논문)
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