Screen charge transfer by grounded tip on ferroelectric surfaces

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We have investigated polarization reversal and charge transfer effects by a grounded tip on 50 nm thick ferroelectric thin films using piezoelectric force microscopy and Kelvin force microscopy. We observed the polarization reversal in the center of written domains, and also identified another mechanism, which is the transfer of screen charges toward the grounded tip. In order to overcome these phenomena, we successfully applied a modified read/write scheme featuring a bias voltage. (c) 2008 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
Publisher
WILEY-V C H VERLAG GMBH
Issue Date
2008-03
Language
English
Article Type
Article
Keywords

NONLINEAR DIELECTRIC MICROSCOPY; FORCE MICROSCOPY

Citation

PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS, v.2, pp.74 - 76

ISSN
1862-6254
DOI
10.1002/pssr.200701265
URI
http://hdl.handle.net/10203/89746
Appears in Collection
MS-Journal Papers(저널논문)
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