DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kim, Yun-Seok | ko |
dc.contributor.author | Kim, Ji-Yoon | ko |
dc.contributor.author | Buhlmann, Simon | ko |
dc.contributor.author | Hong, Daniel Seungbum | ko |
dc.contributor.author | Kim, Yong-Kwan | ko |
dc.contributor.author | Kim, Seung-Hyun | ko |
dc.contributor.author | No, Kwang-Soo | ko |
dc.date.accessioned | 2013-03-07T07:55:59Z | - |
dc.date.available | 2013-03-07T07:55:59Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2008-03 | - |
dc.identifier.citation | PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS, v.2, pp.74 - 76 | - |
dc.identifier.issn | 1862-6254 | - |
dc.identifier.uri | http://hdl.handle.net/10203/89746 | - |
dc.description.abstract | We have investigated polarization reversal and charge transfer effects by a grounded tip on 50 nm thick ferroelectric thin films using piezoelectric force microscopy and Kelvin force microscopy. We observed the polarization reversal in the center of written domains, and also identified another mechanism, which is the transfer of screen charges toward the grounded tip. In order to overcome these phenomena, we successfully applied a modified read/write scheme featuring a bias voltage. (c) 2008 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim. | - |
dc.language | English | - |
dc.publisher | WILEY-V C H VERLAG GMBH | - |
dc.subject | NONLINEAR DIELECTRIC MICROSCOPY | - |
dc.subject | FORCE MICROSCOPY | - |
dc.title | Screen charge transfer by grounded tip on ferroelectric surfaces | - |
dc.type | Article | - |
dc.identifier.wosid | 000254912900013 | - |
dc.identifier.scopusid | 2-s2.0-58849160808 | - |
dc.type.rims | ART | - |
dc.citation.volume | 2 | - |
dc.citation.beginningpage | 74 | - |
dc.citation.endingpage | 76 | - |
dc.citation.publicationname | PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS | - |
dc.identifier.doi | 10.1002/pssr.200701265 | - |
dc.contributor.localauthor | Hong, Daniel Seungbum | - |
dc.contributor.localauthor | No, Kwang-Soo | - |
dc.contributor.nonIdAuthor | Buhlmann, Simon | - |
dc.contributor.nonIdAuthor | Kim, Yong-Kwan | - |
dc.contributor.nonIdAuthor | Kim, Seung-Hyun | - |
dc.description.isOpenAccess | N | - |
dc.type.journalArticle | Article | - |
dc.subject.keywordPlus | NONLINEAR DIELECTRIC MICROSCOPY | - |
dc.subject.keywordPlus | FORCE MICROSCOPY | - |
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