DC Field | Value | Language |
---|---|---|
dc.contributor.author | KIM, JH | ko |
dc.contributor.author | Lee, JeongYong | ko |
dc.contributor.author | NAM, KS | ko |
dc.date.accessioned | 2013-03-02T15:42:24Z | - |
dc.date.available | 2013-03-02T15:42:24Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 1995-01 | - |
dc.identifier.citation | JOURNAL OF APPLIED PHYSICS, v.77, no.1, pp.95 - 102 | - |
dc.identifier.issn | 0021-8979 | - |
dc.identifier.uri | http://hdl.handle.net/10203/74231 | - |
dc.language | English | - |
dc.publisher | AMER INST PHYSICS | - |
dc.subject | DEPOSITED AMORPHOUS-SILICON | - |
dc.subject | POLYCRYSTALLINE SILICON | - |
dc.subject | RECRYSTALLIZATION | - |
dc.title | HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY STUDY OF SOLID-PHASE CRYSTALLIZED SILICON THIN-FILMS ON SIO2 - CRYSTAL-GROWTH AND DEFECTS FORMATION | - |
dc.type | Article | - |
dc.identifier.wosid | A1995PZ85900014 | - |
dc.identifier.scopusid | 2-s2.0-0001817997 | - |
dc.type.rims | ART | - |
dc.citation.volume | 77 | - |
dc.citation.issue | 1 | - |
dc.citation.beginningpage | 95 | - |
dc.citation.endingpage | 102 | - |
dc.citation.publicationname | JOURNAL OF APPLIED PHYSICS | - |
dc.contributor.localauthor | Lee, JeongYong | - |
dc.contributor.nonIdAuthor | KIM, JH | - |
dc.contributor.nonIdAuthor | NAM, KS | - |
dc.type.journalArticle | Article | - |
dc.subject.keywordPlus | DEPOSITED AMORPHOUS-SILICON | - |
dc.subject.keywordPlus | POLYCRYSTALLINE SILICON | - |
dc.subject.keywordPlus | RECRYSTALLIZATION | - |
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