HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY STUDY OF SOLID-PHASE CRYSTALLIZED SILICON THIN-FILMS ON SIO2 - CRYSTAL-GROWTH AND DEFECTS FORMATION

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dc.contributor.authorKIM, JHko
dc.contributor.authorLee, JeongYongko
dc.contributor.authorNAM, KSko
dc.date.accessioned2013-03-02T15:42:24Z-
dc.date.available2013-03-02T15:42:24Z-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.issued1995-01-
dc.identifier.citationJOURNAL OF APPLIED PHYSICS, v.77, no.1, pp.95 - 102-
dc.identifier.issn0021-8979-
dc.identifier.urihttp://hdl.handle.net/10203/74231-
dc.languageEnglish-
dc.publisherAMER INST PHYSICS-
dc.subjectDEPOSITED AMORPHOUS-SILICON-
dc.subjectPOLYCRYSTALLINE SILICON-
dc.subjectRECRYSTALLIZATION-
dc.titleHIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY STUDY OF SOLID-PHASE CRYSTALLIZED SILICON THIN-FILMS ON SIO2 - CRYSTAL-GROWTH AND DEFECTS FORMATION-
dc.typeArticle-
dc.identifier.wosidA1995PZ85900014-
dc.identifier.scopusid2-s2.0-0001817997-
dc.type.rimsART-
dc.citation.volume77-
dc.citation.issue1-
dc.citation.beginningpage95-
dc.citation.endingpage102-
dc.citation.publicationnameJOURNAL OF APPLIED PHYSICS-
dc.contributor.localauthorLee, JeongYong-
dc.contributor.nonIdAuthorKIM, JH-
dc.contributor.nonIdAuthorNAM, KS-
dc.type.journalArticleArticle-
dc.subject.keywordPlusDEPOSITED AMORPHOUS-SILICON-
dc.subject.keywordPlusPOLYCRYSTALLINE SILICON-
dc.subject.keywordPlusRECRYSTALLIZATION-
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