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Results 71-80 of 1344 (Search time: 0.004 seconds).
| NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
|---|---|
| Mixed mediation of supersymmetry breaking in models with anomalous U(1) gauge symmetry Choi, Ki-Woon; Jeong, Kwang Sik; Okumura, Ken-Ichi; Yamaguchi, Masahiro, 16th International Symposium on Particles, Strings and Cosmology, PASCOS 2010, no.1, 2010-07-19 | |
| A metal-dielectric thin film with broadband absorption Cho, S.-H.; Kang, J.-H.; Seo, M.-K.; Yang, J.-K.; Kang, S.-Y.; Lee, Yong-Hee, Emerging Liquid Crystal Technologies V, 2010-01-25 | |
| Nano-beam Lasers and Resonators Lee, Yong-Hee, International Nano-Optoelectronics Workshop , BNNI, 2012-08-10 | |
| Energy transfer in silver and cerium co-doped glass Kim, T; Kim, D; Jang, W; Lim, K.S; Lee, S; Cho, Yong-Hoon, 17th International Conference on Dynamical Processes in Excited States of Solids, DPC'10, v.13, pp.82 - 85, 2010-06-20 | |
| Synchrotron small angle x-ray scattering quantitatively detects angstrom level changes in the average radius of taxol-stabilized microtubules decorated with the microtubule-associated-protein tau Choi, Myung Chul; Raviv, U; Li, Y; Miller, HP; Needleman, DJ; Kim, Mahn-Won; Wilson, L; Feinstein, SC; Safinya, CR, International Symposium on 'Future Trend in Soft Material Research with Advanced Light Source: Interdisciplinary of Bio- and Synthetic-Materials and Industrial Transferring', v.272, no.1, 2010-09-01 | |
| Segregation of B dopants in Si/SiO2 interface Oh, Y. J.; Hwang, J.-H.; Noh, H.-K.; Bang, J.; Ryu, B.; Chang, Kee-Joo, The 6th KIAS Electronic Structure Calculation Workshop, KIAS, 2010-06 | |
| Electronic Structure and Defects in Oxide Semiconductors and Insulators Ryu, B.; Choi, E.-A.; Noh, H.-K.; Bang, J.; Lee, W.-J.; Chang, Kee-Joo, International Conference on Core Research and Engineering Science of Advanced Materials, 2010 | |
| Electronic Structure of Donor-Pair Defects in Si1-xGex Alloy Nanowires Park, JS; Ryu, BK; Chang, Kee-Joo, 제11회 나노와이어 연구회 , 2010-08-20 | |
| Understanding the origin of device instability in amorphous oxide semiconductor thin film transistors Chang, Kee-Joo; Ryu, B.; Noh, HK, 15th International Symposium on the Physics of Semiconductors and Applications, ISPSA, 2011-07 | |
| Stability and segregation of boron dopants in the interface structure between Si and amorphous SiO2 오영준; 노현균; 장기주, 한국물리학회 가을 학술논문발표회 v. no. , 한국물리학회, 2011-10 |