Browse "MS-Journal Papers(저널논문)" by Subject SCANNING PROBE MICROSCOPE
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| Piezoelectric hysteresis measurement using atomic force microscopy Shin, H; Shin, JK; Hong, Daniel Seungbum; Jeon, JU; Song, HW; Hong, JI; No, Kwangsoo, INTEGRATED FERROELECTRICS, v.38, no.1-4, pp.675 - 682, 2001 |
| Read/write mechanisms and data storage system using atomic force microscopy and MEMS technology Shin, H; Hong, S; Moon, J; Jeon, JU, ULTRAMICROSCOPY, v.91, no.1-4, pp.103 - 110, 2002-05 |
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