Browse "MS-Journal Papers(저널논문)" by Subject atomic force microscopy
Showing results 12 to 17 of 17
| Origin of surface potential change during ferroelectric switching in epitaxial PbTiO3 thin films studied by scanning force microscopy Kim, Yun-Seok; Bae, Changdeuck; Ryu, Kyunghee; Ko, Hyoungsoo; Kim, Yong Kwan; Hong, Daniel Seungbum; Shin, Hyunjung, APPLIED PHYSICS LETTERS, v.94, no.3, pp.300 - 305, 2009-01 |
| Piezoelectric hysteresis measurement using atomic force microscopy Shin, H; Shin, JK; Hong, Daniel Seungbum; Jeon, JU; Song, HW; Hong, JI; No, Kwangsoo, INTEGRATED FERROELECTRICS, v.38, no.1-4, pp.675 - 682, 2001 |
| Quartz crystal resonator based scanning probe microscopy Seo, YH; Hong, SB, MODERN PHYSICS LETTERS B, v.19, no.26, pp.1303 - 1322, 2005-11 |
| Read/write mechanisms and data storage system using atomic force microscopy and MEMS technology Shin, H; Hong, S; Moon, J; Jeon, JU, ULTRAMICROSCOPY, v.91, no.1-4, pp.103 - 110, 2002-05 |
| Surface morphology of InGaAs on GaAs(100) by chemical beam epitaxy using unprecracked monoethylarsine, triethylgallium and trimethylindium Park, SJ; Ro, JR; Ha, JS; Kim, SB; Park, HyoHoon; Lee, EH; Yi, JY; et al, SURFACE SCIENCE, v.350, no.1-3, pp.221 - 228, 1996-04 |
| The magnetic properties and morphology of CoCrPtTa/Cr/AlN thin films Chang, HS; Shin, KH; Lee, TD; Park, Joong Keun, JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, v.177, no.181, pp.913 - 914, 1998-01 |
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