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Comprehensive Analysis of Deformation of Interfacial Micro-Nano Structure by Applied Force in Triboelectric Energy Harvester Seol, Myeong-Lok; Han, Jin-Woo; Woo, Jong-Ho; Moon, Dong-Il; Kim, Jee-Yeon; Choi, Yang-Kyu, International Electron Device Meeting (IEDM), IEEE, 2014-12-15 |
First Demonstration of a Wrap-Gated CNT-FET with Vertically-Suspended Channels Lee, Dong-Il; Lee, Byung-Hyun; Yoon, Jin-Su; Choi, Bong-Sik; Park, Jun-Young; Ahn, Dae-Chul; Kim, Choong-Ki; et al, International Electron Devices Meeting (IEDM), International Electron Devices Meeting (IEDM), 2016-12-05 |
Sustainable Electronics for Nano-Spacecraft in Deep Space Missions Moon, Dong-Il; Park, Jun-Young; Han, Jin-Woo; Jeon, Gwang-Jae; Kim, Jee-Yeon; Moon, Jin-Bum; Seol, Myeong-Lok; et al, International Electron Devices Meeting (IEDM), IEEE, 2016-12-07 |
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