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Comprehensive Analysis of Deformation of Interfacial Micro-Nano Structure by Applied Force in Triboelectric Energy Harvester

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Seol, Myeong-Lok / Han, Jin-Woo / Woo, Jong-Ho / Moon, Dong-Il / Kim, Jee-Yeon / Choi, Yang-Kyuresearcher
Publisher
IEEE
Issue Date
2014-12-15
Language
English
Citation

International Electron Device Meeting (IEDM)

URI
http://hdl.handle.net/10203/225547
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EE-Conference Papers(학술회의논문)
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