Comprehensive Analysis of Deformation of Interfacial Micro-Nano Structure by Applied Force in Triboelectric Energy Harvester
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Seol, Myeong-Lok | ko |
| dc.contributor.author | Han, Jin-Woo | ko |
| dc.contributor.author | Woo, Jong-Ho | ko |
| dc.contributor.author | Moon, Dong-Il | ko |
| dc.contributor.author | Kim, Jee-Yeon | ko |
| dc.contributor.author | Choi, Yang-Kyu | ko |
| dc.date.accessioned | 2017-08-31T08:28:33Z | - |
| dc.date.available | 2017-08-31T08:28:33Z | - |
| dc.date.created | 2014-11-25 | - |
| dc.date.created | 2014-11-25 | - |
| dc.date.created | 2014-11-25 | - |
| dc.date.issued | 2014-12-15 | - |
| dc.identifier.citation | International Electron Device Meeting (IEDM) | - |
| dc.identifier.uri | http://hdl.handle.net/10203/225547 | - |
| dc.language | English | - |
| dc.publisher | IEEE | - |
| dc.title | Comprehensive Analysis of Deformation of Interfacial Micro-Nano Structure by Applied Force in Triboelectric Energy Harvester | - |
| dc.type | Conference | - |
| dc.identifier.wosid | 000370384800048 | - |
| dc.identifier.scopusid | 2-s2.0-84938227763 | - |
| dc.type.rims | CONF | - |
| dc.citation.publicationname | International Electron Device Meeting (IEDM) | - |
| dc.identifier.conferencecountry | US | - |
| dc.identifier.conferencelocation | Hilton San Francisco Union Square | - |
| dc.contributor.localauthor | Choi, Yang-Kyu | - |
| dc.contributor.nonIdAuthor | Seol, Myeong-Lok | - |
| dc.contributor.nonIdAuthor | Han, Jin-Woo | - |
| dc.contributor.nonIdAuthor | Woo, Jong-Ho | - |
| dc.contributor.nonIdAuthor | Moon, Dong-Il | - |
| dc.contributor.nonIdAuthor | Kim, Jee-Yeon | - |
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