One of the disadvantages to using recognition as a measure of memory is that scores are often indiscriminantly high because the task is too easy. This paper investigates varying the length of time of exposure during the test, the length of the mask about the test stimulus, the number of exposures to the stimulus and the length of the decay period as variables that might reduce the ceiling effects often associated-with recognition. Data show that controlling test scene length, its interaction with mask length, and decay period can increase the difficulty of the recognition task.