Direct observation of trace elements in BaTiO3 of multilayer ceramic capacitors using atom probe tomography
- Publisher
- CAMBRIDGE UNIV PRESS
- Issue Date
- 2024-05
- Language
- English
- Citation
MICROSCOPY AND MICROANALYSIS
- ISSN
- 1431-9276
- Appears in Collection
- MS-Journal Papers(저널논문)
- Files in This Item
- There are no files associated with this item.
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