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College of Engineering(공과대학)Dept. of Materials Science and Engineering(신소재공학과)MS-Journal Papers(저널논문)

Direct observation of trace elements in BaTiO3 of multilayer ceramic capacitors using atom probe tomography

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dc.contributor.author장규선ko
dc.contributor.authorKim, Mi-Yangko
dc.contributor.authorJung, Chanwonko
dc.contributor.authorKim, Se-Hoko
dc.contributor.authorChoi, Daechulko
dc.contributor.authorPark, Seong-Chanko
dc.contributor.authorScheu, Christinako
dc.contributor.author최벽파ko
dc.date.accessioned2024-09-06T07:00:08Z-
dc.date.available2024-09-06T07:00:08Z-
dc.date.created2024-09-06-
dc.date.issued2024-05-
dc.identifier.citationMICROSCOPY AND MICROANALYSIS-
dc.identifier.issn1431-9276-
dc.identifier.urihttp://hdl.handle.net/10203/322794-
dc.languageEnglish-
dc.publisherCAMBRIDGE UNIV PRESS-
dc.titleDirect observation of trace elements in BaTiO3 of multilayer ceramic capacitors using atom probe tomography-
dc.typeArticle-
dc.type.rimsART-
dc.citation.publicationnameMICROSCOPY AND MICROANALYSIS-
dc.contributor.localauthor최벽파-
dc.contributor.nonIdAuthorKim, Mi-Yang-
dc.contributor.nonIdAuthorJung, Chanwon-
dc.contributor.nonIdAuthorKim, Se-Ho-
dc.contributor.nonIdAuthorChoi, Daechul-
dc.contributor.nonIdAuthorPark, Seong-Chan-
dc.contributor.nonIdAuthorScheu, Christina-
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MS-Journal Papers(저널논문)
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