Dynamic random access memory device with long retention and operating method thereof장시간 전하 저장 DRAM 소자와 그 동작 방법

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Disclosed are a DRAM device capable of storing charges for a long time and an operating method thereof. According to an embodiment, a DRAM device includes a channel region formed on a substrate, a gate insulating film region formed on the channel region, a floating gate region formed on the gate insulating film region, a transition layer region formed on the floating gate region, and a control gate region formed on the transition layer region and generating a potential difference with the floating gate region in response to a fact that a potential that is not less than a reference potential is applied and releasing at least one charge stored in the floating gate region or storing the at least one charge into the floating gate region, by generating a transition current due to the potential difference.
Assignee
KAIST
Country
US (United States)
Application Date
2022-02-17
Application Number
17674301
Registration Date
2024-03-05
Registration Number
11922988
URI
http://hdl.handle.net/10203/319104
Appears in Collection
EE-Patent(특허)
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