Highly stable top gate top contact ITZO TFT deposited by using high density plasma sputtering

Cited 2 time in webofscience Cited 0 time in scopus
  • Hit : 113
  • Download : 0
Top gate top contact (TGTC) structured thin film transistors with In-Sn-Zn-O active layer deposited by high density plasma sputtering (HDP) have been successfully fabricated. The HDP ITZO TFT achieved saturation mobility of 27.8cm
Publisher
Institute of Electrical and Electronics Engineers Inc.
Issue Date
2016-07
Language
English
Citation

23rd International Workshop on Active-Matrix Flatpanel Displays and Devices, AM-FPD 2016, pp.183 - 184

DOI
10.1109/AM-FPD.2016.7543658
URI
http://hdl.handle.net/10203/312871
Appears in Collection
MS-Conference Papers(학술회의논문)
Files in This Item
There are no files associated with this item.
This item is cited by other documents in WoS
⊙ Detail Information in WoSⓡ Click to see webofscience_button
⊙ Cited 2 items in WoS Click to see citing articles in records_button

qr_code

  • mendeley

    citeulike


rss_1.0 rss_2.0 atom_1.0