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Park, Seongjin; Kim, Kang; Park, Sang-Hee Ko, PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, v.221, no.9, 2024-05
Ko, Jong Beom; Park, Sang-Hee Ko, MATERIALS LETTERS, v.363, 2024-05
Jeong, Wooseok; Cho, Seong-In; Park, Sang-Hee Ko; et al, MATERIALS LETTERS, v.355, 2024-01
Jeong, Sehun; Kim, Jingyu; Cho, Seong-In; et al, BIOSENSORS & BIOELECTRONICS, v.241, 2023-12
Im, Youngjun; Cho, Seong-In; Kim, Jingyu; et al, IEEE ELECTRON DEVICE LETTERS, v.44, no.11, pp.1849 - 1852, 2023-11
Jeon, Sori; Lee, Kwang-Heum; Lee, Seung-Hee; et al, JOURNAL OF MATERIALS CHEMISTRY C, v.11, no.41, pp.14177 - 14186, 2023-10
Ko, Jong Beom; Cho, Seong-In; Park, Sang-Hee Ko, ACS APPLIED MATERIALS & INTERFACES, v.15, no.40, pp.47799 - 47809, 2023-09
Yeom, Hye-In; Kim, Jingyu; Jeon, Guk-Jin; et al, IEEE ELECTRON DEVICE LETTERS, v.44, no.5, pp.801 - 804, 2023-05
Cho, Seong-In; Woo, Namgyu; Jeong, Hyun-Jun; et al, IEEE ELECTRON DEVICE LETTERS, v.44, no.4, pp.650 - 653, 2023-04
Woo, Namgyu; Cho, Seong-In; Park, Sang-Hee Ko, ADVANCED MATERIALS INTERFACES, v.10, no.12, 2023-04
Yeom, Hye-In; Kim, Jingyu; Jeon, Guk-Jin; et al, JOURNAL OF MATERIALS CHEMISTRY C, v.11, no.4, pp.1336 - 1345, 2023-02
Kim, Jang Hwan; Jeong, Hyeon U.; Yeom, Hye-In; et al, ADVANCED MATERIALS, v.35, no.3, 2023-01
Yang, Junghoon; Oh, Yeon-Wha; Siracosit, Sarawut; et al, IEEE ELECTRON DEVICE LETTERS, v.43, no.11, pp.1973 - 1976, 2022-11
Kim, Do Hyung; Lee, Kwang-Heum; Lee, Seung Hee; et al, IEEE ELECTRON DEVICE LETTERS, v.43, no.10, pp.1677 - 1680, 2022-10
Yang, Junghoon; Park, HyunWoo; Kim, Baul; et al, JOURNAL OF MATERIALS CHEMISTRY C, v.10, no.26, pp.9699 - 9706, 2022-07
Jin, Taiyu; Park, Sang-Hee Ko; Fang, Da-Wei, RSC ADVANCES, v.12, no.33, pp.21014 - 21021, 2022-07
Kim, Jingyu; Jeong, Sehun; Sarawut, Siracosit; et al, LAB ON A CHIP, v.22, no.5, pp.899 - 907, 2022-03
Cho, Seong-In; Ko, Jong Beom; Lee, Seung Hee; et al, JOURNAL OF ALLOYS AND COMPOUNDS, v.893, 2022-02
Lee, Kwang-Heum; Lee, Seung Hee; Cho, Sang-Joon; et al, MICROELECTRONIC ENGINEERING, v.253, 2022-01
Kim, Junsung; Kim, Do Hyung; Cho, Seong-In; et al, IEEE ELECTRON DEVICE LETTERS, v.42, no.12, pp.1798 - 1801, 2021-12
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