학위논문(박사) - 한국과학기술원 : 전기및전자공학부, 2020.2,[iv, 50 p. :]
Phase Change Memory▼amemory architecture▼areliability▼awrite disturbance▼awrite endurance▼acell lifetime; 상변화 메모리▼a메모리 아키텍처▼a신뢰성▼a쓰기 간섭▼a쓰기 내구성▼a셀 수명
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.