A Low-Integrated-Phase-Noise 27-30-GHz Injection-Locked Frequency Multiplier With an Ultra-Low-Power Frequency-Tracking Loop for mm-Wave-Band 5G Transceivers

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dc.contributor.authorYoo, Seyeonko
dc.contributor.authorChoi, Seojinko
dc.contributor.authorKim, Juyeopko
dc.contributor.authorYoon, Heeinko
dc.contributor.authorLee, Yongsunko
dc.contributor.authorChoi, Jaehyoukko
dc.date.accessioned2019-08-08T00:20:06Z-
dc.date.available2019-08-08T00:20:06Z-
dc.date.created2019-08-07-
dc.date.created2019-08-07-
dc.date.created2019-08-07-
dc.date.created2019-08-07-
dc.date.issued2018-02-
dc.identifier.citationIEEE JOURNAL OF SOLID-STATE CIRCUITS, v.53, no.2, pp.375 - 388-
dc.identifier.issn0018-9200-
dc.identifier.urihttp://hdl.handle.net/10203/264097-
dc.description.abstractAn ultra-low-phase-noise injection-locked frequency multiplier (ILFM) for millimeter wave (mm-wave) fifth-generation transceivers is presented. Using an ultra-low-power frequency-tracking loop (FTL), the proposed ILFM is able to correct the frequency drifts of the quadrature voltage-controlled oscillator of the ILFM in a real-time fashion. Since the FTL is monitoring the averages of phase deviations rather than detecting or sampling the instantaneous values, it requires only 600 mu W to continue to calibrate the ILFM that generates an mm-wave signal with an output frequency from 27 to 30 GHz. The proposed ILFM was fabricated in a 65-nm CMOS process. The 10-MHz phase noise of the 29.25-GHz output signal was -129.7 dBc/Hz, and its variations across temperatures and supply voltages were less than 2 dB. The integrated phase noise from 1 kHz to 100 MHz and the rms jitter were -39.1 dBc and 86 fs, respectively.-
dc.languageEnglish-
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC-
dc.titleA Low-Integrated-Phase-Noise 27-30-GHz Injection-Locked Frequency Multiplier With an Ultra-Low-Power Frequency-Tracking Loop for mm-Wave-Band 5G Transceivers-
dc.typeArticle-
dc.identifier.wosid000423546800004-
dc.identifier.scopusid2-s2.0-85030682541-
dc.type.rimsART-
dc.citation.volume53-
dc.citation.issue2-
dc.citation.beginningpage375-
dc.citation.endingpage388-
dc.citation.publicationnameIEEE JOURNAL OF SOLID-STATE CIRCUITS-
dc.identifier.doi10.1109/JSSC.2017.2749420-
dc.contributor.localauthorChoi, Jaehyouk-
dc.contributor.nonIdAuthorYoo, Seyeon-
dc.contributor.nonIdAuthorChoi, Seojin-
dc.contributor.nonIdAuthorKim, Juyeop-
dc.contributor.nonIdAuthorYoon, Heein-
dc.contributor.nonIdAuthorLee, Yongsun-
dc.description.isOpenAccessN-
dc.type.journalArticleArticle-
dc.subject.keywordAuthorCalibrator-
dc.subject.keywordAuthorfifth-generation (5G) transceivers-
dc.subject.keywordAuthorfrequency multiplier-
dc.subject.keywordAuthorfrequency-tracking loop (FTL)-
dc.subject.keywordAuthorinjection locked-
dc.subject.keywordAuthorintegrated phase noise (IPN)-
dc.subject.keywordAuthorprocess-voltage-temperature (PVT)-
dc.subject.keywordPlusCLOCK MULTIPLIER-
dc.subject.keywordPlusPLL-
dc.subject.keywordPlusDESIGN-
dc.subject.keywordPlusSYNTHESIZER-
dc.subject.keywordPlusOSCILLATOR-
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