A Comprehensive Study of Hot-Carrier Behaviors with Consideration of Non-Local, Series Resistance, Quantum, and Temperature Effects in Multi-Gate FinFETs
- Publisher
- Japan society of applied physics
- Issue Date
- 2007-09
- Language
- ENG
- Citation
International Conference on Solid State Device and Materials, pp.458 - 459
- Appears in Collection
- EE-Conference Papers(학술회의논문)
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