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Showing results 1 to 16 of 16

1
3D Refractive Index Tomogram and Structured Illumination Microscopy System using Wavefront Shaper and Method thereof

Park, Yong Keun; Shin, Seungwoo; Park, Gwang Sik, 2018-09-25

2
3d refractive index tomography and structured illumination microscopy system using wavefront shaper and method thereof

Park, Yong Keun; Sjin, Seungwoo; Park, Gwangsik

3
Apparatus and method for detecting microbes or bacteria

Park, Yong Keun; Yoon, Jonghee; Lee, KyeoReh, 2018-06-19

4
Apparatus and method for forming 3-dimensional holographic image using aperiodically structured optical elements

Park, Yong Keun; Park, Jong chan; Lee, KyeoReh

5
Apparatus and method for single-channel digital optical phase conjugation

Park, Yong Keun; Lee, Kyeo Reh, 2018-07-31

6
Apparatus for detecting sample properties using chaotic wave sensor

Park, Yong Keun; Yoon, JongHee; Lee, Kyeoreh; Kim, Young Dug; Kim, Nam Kyun

7
Apparatus for Detecting Sample Properties Using Chaotic Wave Sensor

Park, Yong Keun; Yoon, JongHee; Lee, KyeoReh; Kim, Young Dug; Kim, Nam Kyun

8
Computing device for algorithm to reconstruct three-dimensional tomogram by considering multiple scattering, and method of the same

Park, Yong Keun; Lee, Moosung; Herve Jerome Hugonnet

9
Correction pattern obtaining apparatus for correcting noise generated by optical element included in display and method of obtaining noise correction pattern using the same

Park, Yong Keun; Park, Jongchan; Seo, Wontaek; Song, Hoon; An, Jungkwuen

10
EFFICIENT AND DIRECTIONAL NON-RESONANCE LASER USING SCATTERING CAVITY AND MANUFACTURING METHOD THEREOF

Park, Yong Keun; Lee, KyeoReh

11
Optical detection system

Park, Hui Jun; Lee, Kyeo Reh; Shin, Seung Woo; Park, Yong Keun

12
Optical detection system

Park, Yong Keun; Park, Hui Jun; Lee, Kyeo Reh; Shin, Seung Woo

13
Pattern structure inspection device and inspection method

Park, Yong Keun; Park, Jongchan; Kim, Young Dug

14
PATTERN STRUCTURE INSPECTION DEVICE AND INSPECTION METHOD

Park, Yong Keun; Park, Jong Chan

15
PATTERN STRUCTURE INSPECTION DEVICE AND INSPECTION METHOD

Park, Yong Keun; Park, Jong Chan

16
PATTERN STRUCTURE INSPECTION DEVICE AND INSPECTION METHOD

Park, Yong Keun; Park, Jongchan

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