3d refractive index tomography and structured illumination microscopy system using wavefront shaper and method thereof파면 제어기를 이용한 초고속 3차원 굴절률 영상 촬영 및 형광 구조화 조도 현미경 시스템 및 이를 이용한 방법

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An ultra-high-speed three-dimensional refractive index image shooting and fluorescent structured light illuminating microscope system using a wave surface shaper and a using method thereof are disclosed. The use method of the ultra-high-speed three-dimensional refractive index image shooting and fluorescent structured light illuminating microscope system by using the wave surface shaper comprises the following steps of: adjusting the irradiation angle of the plane wave incident to the sample by using a wave surface shaper; determining a two-dimensional light field through the sample based on an illumination angle of the plane wave; and acquiring a three-dimensional refractive index image by utilizing an optical diffraction tomography method or a filtering back projection algorithm based on the measured two-dimensional light field information.
Assignee
KAIST
Country
CC (Cocos (Keeling) Islands)
Application Date
2016-08-23
Application Number
201610712730.3
Registration Date
2021-03-05
Registration Number
107490562
URI
http://hdl.handle.net/10203/285284
Appears in Collection
PH-Patent(특허)
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