3d refractive index tomography and structured illumination microscopy system using wavefront shaper and method thereof파면 제어기를 이용한 초고속 3차원 굴절률 영상 촬영 및 형광 구조화 조도 현미경 시스템 및 이를 이용한 방법

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dc.contributor.authorPark, Yong Keunko
dc.contributor.authorSjin, Seungwooko
dc.contributor.authorPark, Gwangsikko
dc.date.accessioned2021-05-18T02:30:18Z-
dc.date.available2021-05-18T02:30:18Z-
dc.identifier.urihttp://hdl.handle.net/10203/285284-
dc.description.abstractAn ultra-high-speed three-dimensional refractive index image shooting and fluorescent structured light illuminating microscope system using a wave surface shaper and a using method thereof are disclosed. The use method of the ultra-high-speed three-dimensional refractive index image shooting and fluorescent structured light illuminating microscope system by using the wave surface shaper comprises the following steps of: adjusting the irradiation angle of the plane wave incident to the sample by using a wave surface shaper; determining a two-dimensional light field through the sample based on an illumination angle of the plane wave; and acquiring a three-dimensional refractive index image by utilizing an optical diffraction tomography method or a filtering back projection algorithm based on the measured two-dimensional light field information.-
dc.title3d refractive index tomography and structured illumination microscopy system using wavefront shaper and method thereof-
dc.title.alternative파면 제어기를 이용한 초고속 3차원 굴절률 영상 촬영 및 형광 구조화 조도 현미경 시스템 및 이를 이용한 방법-
dc.typePatent-
dc.type.rimsPAT-
dc.contributor.localauthorPark, Yong Keun-
dc.contributor.nonIdAuthorSjin, Seungwoo-
dc.contributor.nonIdAuthorPark, Gwangsik-
dc.contributor.assigneeKAIST-
dc.identifier.iprsType특허-
dc.identifier.patentApplicationNumber201610712730.3-
dc.identifier.patentRegistrationNumber107490562-
dc.date.application2016-08-23-
dc.date.registration2021-03-05-
dc.publisher.countryCC-
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