Transparent Al-Zn-Sn-O thin film transistors prepared at low temperature

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We have fabricated transparent bottom gate thin film transistors (TFTs) using Al-doped zinc tin oxide (AZTO) as active layers. The AZTO active layer was deposited by rf magnetron sputtering at room temperature. The AZTO TFT showed good TFT performance without postannealing. The field effect mobility and the subthreshold swing were improved by postannealing below 180 degrees C. The AZTO TFT exhibited a field effect mobility (mu(FET)) of 10.1 cm(2)/V s, a turn-on voltage (V-on) of 0.4 V, a subthreshold swing (S/S) of 0.6 V/decade, and an on/off ratio (I-on/I-off) of 10(9). (C) 2008 American Institute of Physics. [DOI: 10.1063/1.2998612]
Publisher
AMER INST PHYSICS
Issue Date
2008-10
Language
English
Article Type
Article
Keywords

AMORPHOUS OXIDE SEMICONDUCTORS; TRANSPORT

Citation

APPLIED PHYSICS LETTERS, v.93, no.14

ISSN
0003-6951
DOI
10.1063/1.2998612
URI
http://hdl.handle.net/10203/201779
Appears in Collection
MS-Journal Papers(저널논문)
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