Logarithmic dependence of the surface anisotropy on the low-angle X-ray diffraction intensity in Co-based multilayers
We have investigated the dependence of the surface anisotropy on the interfacial microstructure in Co/Pd and Co/Pt multilayers prepared by sputtering. The interfacial microstructure of multilayers was manipulated by changing sputtering Ar gas pressure in the preparation of samples. The surface anisotropy of Co/Pd and Co/Pt multilayers was sensitively dependent on the interfacial microstructural modification and the surface anisotropy of those multilayers was found to be logarithmically dependent on the integrated low-angle X-ray diffraction intensity.
- Publisher
- ELSEVIER SCIENCE SA
- Issue Date
- 1997-06
- Language
- English
- Article Type
- Article
- Keywords
PERPENDICULAR MAGNETIC-ANISOTROPY; THIN-FILMS; MAGNETOOPTICAL PROPERTIES; COERCIVITY; PD/CO
- Citation
THIN SOLID FILMS, v.301, no.1-2, pp.249 - 252
- ISSN
- 0040-6090
- Appears in Collection
- RIMS Journal Papers
- Files in This Item
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