Logarithmic dependence of the surface anisotropy on the low-angle X-ray diffraction intensity in Co-based multilayers

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dc.contributor.authorKim, JHko
dc.contributor.authorShin, Sung-Chulko
dc.date.accessioned2010-11-17T01:26:29Z-
dc.date.available2010-11-17T01:26:29Z-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.issued1997-06-
dc.identifier.citationTHIN SOLID FILMS, v.301, no.1-2, pp.249 - 252-
dc.identifier.issn0040-6090-
dc.identifier.urihttp://hdl.handle.net/10203/20067-
dc.description.abstractWe have investigated the dependence of the surface anisotropy on the interfacial microstructure in Co/Pd and Co/Pt multilayers prepared by sputtering. The interfacial microstructure of multilayers was manipulated by changing sputtering Ar gas pressure in the preparation of samples. The surface anisotropy of Co/Pd and Co/Pt multilayers was sensitively dependent on the interfacial microstructural modification and the surface anisotropy of those multilayers was found to be logarithmically dependent on the integrated low-angle X-ray diffraction intensity.-
dc.description.sponsorshipThis work was supported by the Ministry of Science and Technology of Korea and the Korea Science and Engineering Foundation under Grant No. 941-0200-031-2.en
dc.languageEnglish-
dc.language.isoen_USen
dc.publisherELSEVIER SCIENCE SA-
dc.subjectPERPENDICULAR MAGNETIC-ANISOTROPY-
dc.subjectTHIN-FILMS-
dc.subjectMAGNETOOPTICAL PROPERTIES-
dc.subjectCOERCIVITY-
dc.subjectPD/CO-
dc.titleLogarithmic dependence of the surface anisotropy on the low-angle X-ray diffraction intensity in Co-based multilayers-
dc.typeArticle-
dc.identifier.wosidA1997XJ08400039-
dc.identifier.scopusid2-s2.0-0031152732-
dc.type.rimsART-
dc.citation.volume301-
dc.citation.issue1-2-
dc.citation.beginningpage249-
dc.citation.endingpage252-
dc.citation.publicationnameTHIN SOLID FILMS-
dc.embargo.liftdate9999-12-31-
dc.embargo.terms9999-12-31-
dc.contributor.localauthorShin, Sung-Chul-
dc.contributor.nonIdAuthorKim, JH-
dc.type.journalArticleArticle-
dc.subject.keywordAuthoranisotropy-
dc.subject.keywordAuthormagnetic properties and measurements-
dc.subject.keywordAuthorsurface and interface states-
dc.subject.keywordAuthorX-ray diffraction-
dc.subject.keywordPlusPERPENDICULAR MAGNETIC-ANISOTROPY-
dc.subject.keywordPlusTHIN-FILMS-
dc.subject.keywordPlusMAGNETOOPTICAL PROPERTIES-
dc.subject.keywordPlusCOERCIVITY-
dc.subject.keywordPlusPD/CO-
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