Browse "School of Electrical Engineering(전기및전자공학부)" by Subject gate-induced drain leakage (GIDL)

Showing results 1 to 10 of 10

1
A Novel Charge Pumping Technique With Gate-Induced Drain Leakage Current

Lee, Geon-Beom; Kim, Jeong-Yeon; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.44, no.5, pp.709 - 712, 2023-05

2
Comprehensive Analysis of Gate-Induced Drain Leakage in Vertically Stacked Nanowire FETs: Inversion-Mode Versus Junctionless Mode

Hur, Jae; Lee, Byung-Hyun; Kang, Min-Ho; Ahn, Dae-Chul; Bang, Tewook; Jeon, Seung-Bae; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.37, no.5, pp.541 - 544, 2016-05

3
Curing of Hot-Carrier Induced Damage by Gate-Induced Drain Leakage Current in Gate-All-Around FETs

Park, Jun-Young; Yun, Dae-Hwan; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.40, no.12, pp.1909 - 1912, 2019-12

4
Effect of Off-state Stress on Gate-Induced Drain Leakage by Interface Traps in Buried-Gate FETs

Lee, Geon-Beom; Kim, Choong-Ki; Yoo, Min-Soo; Hur, Jae; Choi, Yang-Kyu, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.66, no.12, pp.5126 - 5132, 2019-11

5
Gate-Induced Drain-Leakage (GIDL) Programming Method for Soft-Programming-Free Operation in Unified RAM (URAM)

Han, Jin-Woo; Ryu, Seong-Wan; Choi, Sung-Jin; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.30, no.2, pp.189 - 191, 2009-02

6
Improvement of the Sensing Window on a Capacitorless 1T-DRAM of a FinFET-Based Unified RAM

Choi, Sung-Jin; Han, Jin-Woo; Kim, Chung-Jin; Kim, Sung-Ho; Choi, Yang-Kyu, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.56, no.12, pp.3228 - 3231, 2009-12

7
Investigation of gate-induced drain leakage (GIDL) current in thin body devices: Single-gate ultra-thin body, symmetrical double-gate, and asymmetrical double-gate MOSFETs

Choi, Yang-Kyu; Ha, D; King, TJ; Bokor, J, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS, v.42, no.4B, pp.2073 - 2076, 2003-04

8
Investigation of Leaky Characteristic in a Single-Transistor-Based Leaky Integrate-and-Fire Neuron

Han, Joon-Kyu; Kim, Myung-Su; Kim, Seung-Il; Lee, Mun-Woo; Lee, Sang-Won; Yu, Ji-Man; Choi, Yang-Kyu, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.68, no.11, pp.5912 - 5915, 2021-11

9
Off-state leakage in MOSFET considering source/drain extension regions

Hur, Jae; Jeong, Woo Jin; Shin, Mincheol; Choi, Yang-Kyu, SEMICONDUCTOR SCIENCE AND TECHNOLOGY, v.36, no.8, pp.085018, 2021-08

10
Tunneling Effects in a Charge-Plasma Dopingless Transistor

Hur, Jae; Moon, Dong-Il; Han, Jin-Woo; Kim, Gun-Hee; Jeon, Chang-Hoon; Choi, Yang-Kyu, IEEE TRANSACTIONS ON NANOTECHNOLOGY, v.16, no.2, pp.315 - 320, 2017-03

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