Browse "School of Electrical Engineering(전기및전자공학부)" by Subject INDUCED INTERFACE
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| Curing of Aged Gate Dielectric by the Self-Heating Effect in MOSFETs Park, Jun-Young; Moon, Dong-Il; Lee, Geon-Beom; Choi, Yang-Kyu, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.67, no.3, pp.777 - 788, 2020-03 |
| Curing of Hot-Carrier Induced Damage by Gate-Induced Drain Leakage Current in Gate-All-Around FETs Park, Jun-Young; Yun, Dae-Hwan; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.40, no.12, pp.1909 - 1912, 2019-12 |
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