Showing results 16581 to 16600 of 51490
Electrostatic digital micromirror using interdigitated cantilevers and its applications = 엇물린 외팔보를 이용한 정전 디지털 마이크로미러와 그 응용link Jeon, Jin-Wan; 전진완; et al, 한국과학기술원, 2005 |
Electrostatic Energy Harvaster for Low-Frequency Vibration by Human Physical Motions using Luquid Choi, DH; Han, CH; Kim , HD; Yoon, Jun-Bo, Power MEMS 2010, Power MEMS 2010, 2010-11-30 |
Electrostatic micro-actuator with a pre-charged series capacitor: modeling, design, and demonstration Yang, Hyun-Ho; Han, Chang-Hoon; Lee, Jeong Oen; Yoon, Jun-Bo, JOURNAL OF MICROMECHANICS AND MICROENGINEERING, v.24, no.6, 2014-06 |
Electrostatic microactuator devices for display application = 디스플레이 응용을 위한 미소구동체 소자link Jo, Sung-Hyun; 조성현; et al, 한국과학기술원, 2005 |
Electrostatic mode-matching solution for CTEM cell Kim, Hyunsoo; Eom, Hyo Joon, 2015 1st IEEE International Conference on Computational Electromagnetics, ICCEM 2015, pp.164 - 165, Institute of Electrical and Electronics Engineers Inc., 2015-02 |
Electrostatic potential distribution through a rectangular aperture in a thick conducting plane Park, HH; Eom, Hyo Joon, IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, v.44, no.10, pp.1745 - 1747, 1996-10 |
Electrostatic potential distribution through multiple rectangular apertures in a tick conducting plane Eom, Hyo Joon; Park, HH, PIERS 1998, pp.289 - 289, 1998 |
Electrostatic potential distribution through thick multiple rectangular apertures Park, HH; Eom, Hyo Joon, ELECTRONICS LETTERS, v.34, no.15, pp.1500 - 1501, 1998-07 |
Electrostatic potential due to a potential drop across a slit Noh, YC; Eom, Hyo Joon, IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, v.46, no.4, pp.428 - 430, 1998-04 |
Electrostatic potential penetration into two circular apertures in a thick conducting plane Park, YB; Eom, Hyo Joon, ELECTROMAGNETICS, v.22, no.7, pp.581 - 589, 2002-10 |
Electrostatic potential through a circular aperture in a thick conducting plane Eom, Hyo Joon, APMC Proceedings, pp.666 - 669, 1995 |
Electrostatic potential through a circular aperture in a thick conducting plane Lee, JH; Eom, Hyo Joon, IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, v.44, no.2, pp.341 - 343, 1996-02 |
Electrostatic solution for 3-port pyramidal cell Kim, Dohoon; Eom, Hyo Joon; Lee, Young Seung, IEICE ELECTRONICS EXPRESS, v.11, no.10, 2014-05 |
Electrostatic Solution for Broadside-Coupled Striplines in a Shield Park, Juncheol; Kim, Dohoon; Eom, Hyo Joon; Jeon, Sangbong, IEICE TRANSACTIONS ON COMMUNICATIONS, v.E96B, no.1, pp.325 - 328, 2013-01 |
Electrostatic switching biosensor – a novel label-free DNA detection using an Electrode charging technique Hwang, S.-U.; Choi, J.-M.; Yang, H.-H.; Kim, C.-H.; Jung, C.; Park, H.G.; Choi, Yang-Kyu; et al, 24th IEEE International Conference on Micro Electro Mechanical Systems, MEMS 2011, pp.857 - 860, IEEE, 2011-01-23 |
Electroststic Discharge(ESD) Effects on Wireless Power Transfer using Magnetic Resonance Coupling Kim, Joung-Ho; Kim, Sukjin; Cho, Yeonje; Kim, Jonghoon J.; Bae, Bumhee; Kong, Sunkyu, 2014 IEEE International Symposium on Electromagnetic Compatibility(EMC&SI/PI), 2014 IEEE International Symposium on Electromagnetic Compatibility(EMC&SI/PI), 2014-08-05 |
Electrothermal analysis with generalized boundary conditions Choi, Su Hyeong; Shim, Seong Bo; Shin, Young Soo, 12th International SoC Design Conference, pp.39 - 40, 대한전자공학회, IEEE, 2015-11-03 |
Electrothermal Analysis With Nonconvective Boundary Conditions Choi, Suhyeong; Shim, Seongbo; Shin, Youngsoo, IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS, v.65, no.8, pp.1044 - 1048, 2018-08 |
Electrothermal Annealing (ETA) Method to Enhance the Electrical Performance of Amorphous-Oxide-Semiconductor (AOS) Thin-Film Transistors (TFTs) Kim, Choong-Ki; Kim, Eungtaek; Lee, Myung Keun; Park, Jun-Young; Seol, Myeong-Lok; Bae, Hagyoul; Bang, Tewook; et al, ACS APPLIED MATERIALS & INTERFACES, v.8, no.36, pp.23820 - 23826, 2016-09 |
Electrothermal Annealing to Enhance the Electrical Performance of an Exfoliated MOS2 Field-Effect Transistor Han, Joon-Kyu; Park, Jun-Young; Kim, Choong-Ki; Kwon, Jeong Hyun; Kim, Myeong-Soo; Hwang, Byeong Woon; Kim, Da-Jin; et al, IEEE ELECTRON DEVICE LETTERS, v.39, no.10, pp.1532 - 1535, 2018-10 |
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