Electrostatic potential due to a potential drop across a slit

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The electrostatic potential and charge density due to a potential drop across a slit in a thick conducting plane are obtained in analytic closed form. The Fourier transform, mode matching, and superposition are used to represent the potential in the spectral domain. The residue calculus is applied to represent the potential distribution in converging series form. Numerical computations are performed to illustrate the charge-density distribution through a slit.
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Issue Date
1998-04
Language
English
Article Type
Article
Citation

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, v.46, no.4, pp.428 - 430

ISSN
0018-9480
URI
http://hdl.handle.net/10203/76254
Appears in Collection
EE-Journal Papers(저널논문)
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