Browse "Dept. of Nuclear and Quantum Engineering(원자력및양자공학과)" by Subject NOISE

Showing results 1 to 8 of 8

1
A Feasibility Study of Low-Dose Single-Scan Dual-Energy Cone-Beam CT in Many-View Under-Sampling Framework

Lee, Donghyeon; Lee, Jiseoc; Kim, Hoyi; Lee, Taewon; Soh, Jeongtae; Park, Miran; Kim, Changhwan; et al, IEEE TRANSACTIONS ON MEDICAL IMAGING, v.36, no.12, pp.2578 - 2587, 2017-12

2
A new cross-detection method for improved energy-resolving photon counting under pulse pile-up

Lee, Daehee; Lim, Kyung Taek; Park, Kyungjin; Lee, Changyeop; Cho, Gyuseong, Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, v.867, pp.154 - 162, 2017-09

3
Backprojection-filtration reconstruction without invoking a spatially varying weighting factor

Xia, Dan; Cho, Seungryong; Pan, Xiaochuan, MEDICAL PHYSICS, v.37, no.3, pp.1201 - 1209, 2010-03

4
Characterization of a 14 in x 17 in flat panel detector based on ion shower doped a-Si : H P-I-N diodes

Kim, HJ; Cho, Gyuseong, IEEE TRANSACTIONS ON NUCLEAR SCIENCE, v.50, pp.1654 - 1658, 2003-10

5
Edge gain suppression of a planar-type InGaAs-InP avalanche photodiodes with thin multiplication layers for 10-Gb/s applications

Burm, J; Choi, JY; Cho, Seungryong; Kim, MD; Yang, SK; Back, JM; Rhee, DY; et al, IEEE PHOTONICS TECHNOLOGY LETTERS, v.16, no.7, pp.1721 - 1723, 2004-07

6
Effect of electric field on primary dark pulses in SPADs for advanced radiation detection applications

Lim, Kyung Taek; Kim, Hyoungtaek; Kim, Jinhwan; Cho, Gyuseong, NUCLEAR ENGINEERING AND TECHNOLOGY, v.53, no.2, pp.618 - 625, 2021-02

7
HIGH-SENSITIVITY READOUT OF 2D A-SI IMAGE SENSORS

FUJIEDA, I; STREET, RA; WEISFIELD, RL; NELSON, S; NYLEN, P; PEREZMENDEZ, V; Cho, Gyuseong, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS, v.32, no.1A, pp.198 - 204, 1993-01

8
Image reconstruction in reduced circular sinusoidal cone-beam CT

Xia, Dan; Cho, Seungryong; Pan, Xiaochuan, JOURNAL OF X-RAY SCIENCE AND TECHNOLOGY, v.17, no.3, pp.189 - 205, 2009

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